Abstract
The x-ray-induced ‘‘blue’’ emission from commercially available, high-quality synthetic quartz has been studied between 80 and 300 K. Three overlapping bands, each having a different quenching temperature, have been experimentally resolved in the as-grown crystals. These bands peak at 440, 425, and 380 nm; their half-widths are 0.64, 0.75, and 0.92 eV; and they thermally quench in the 120–160, 170–210, and 220–270 K regions, respectively. An intense electron irradiation at room temperature or an electrodiffusion (sweep) in a hydrogen atmosphere eliminates the band at 380 nm. Our results suggest that the 380-nm band arises from recombination of an electron with a hole trapped adjacent to an alkali-compensated aluminum ion (i.e., an Al–M+ center). The origins of the bands at 440 and 425 nm remain unknown. As an application of these results, a screening test is described which could assist quality control during selection of quartz bars for use in precision frequency control devices.
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Dates
Type | When |
---|---|
Created | 22 years, 6 months ago (Feb. 14, 2003, 1:32 p.m.) |
Deposited | 1 year, 7 months ago (Feb. 4, 2024, 9:15 p.m.) |
Indexed | 3 months, 1 week ago (May 28, 2025, 10:03 a.m.) |
Issued | 42 years ago (Sept. 1, 1983) |
Published | 42 years ago (Sept. 1, 1983) |
Published Print | 42 years ago (Sept. 1, 1983) |
@article{Alonso_1983, title={X-ray-induced luminescence in crystalline SiO2}, volume={54}, ISSN={1089-7550}, url={http://dx.doi.org/10.1063/1.332715}, DOI={10.1063/1.332715}, number={9}, journal={Journal of Applied Physics}, publisher={AIP Publishing}, author={Alonso, P. J. and Halliburton, L. E. and Kohnke, E. E. and Bossoli, R. B.}, year={1983}, month=sep, pages={5369–5375} }