Crossref journal-article
AIP Publishing
Journal of Applied Physics (317)
Abstract

NbnAlm multilayer films grown on oxidized Si(100) at room temperature by magnetron sputtering have Nb[110] and A[111] texture. The films have ∼1% coherency strains which decrease with increasing modulation wavelength. The composition modulation is approximately a trapezoidal wave with interfacial regions ∼11 Å thick as a result of grain boundary diffusion.

Bibliography

McWhan, D. B., Gurvitch, M., Rowell, J. M., & Walker, L. R. (1983). Structure and coherence of NbAl multilayer films. Journal of Applied Physics, 54(7), 3886–3891.

Authors 4
  1. D. B. McWhan (first)
  2. M. Gurvitch (additional)
  3. J. M. Rowell (additional)
  4. L. R. Walker (additional)
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Dates
Type When
Created 22 years, 6 months ago (Feb. 14, 2003, 1:32 p.m.)
Deposited 1 year, 6 months ago (Feb. 4, 2024, 9:10 p.m.)
Indexed 2 months, 1 week ago (June 16, 2025, 8:07 a.m.)
Issued 42 years, 1 month ago (July 1, 1983)
Published 42 years, 1 month ago (July 1, 1983)
Published Print 42 years, 1 month ago (July 1, 1983)
Funders 0

None

@article{McWhan_1983, title={Structure and coherence of NbAl multilayer films}, volume={54}, ISSN={1089-7550}, url={http://dx.doi.org/10.1063/1.332560}, DOI={10.1063/1.332560}, number={7}, journal={Journal of Applied Physics}, publisher={AIP Publishing}, author={McWhan, D. B. and Gurvitch, M. and Rowell, J. M. and Walker, L. R.}, year={1983}, month=jul, pages={3886–3891} }