DOI: 10.1063/1.3319591. Voltage-time dilemma of pure electronic mechanisms in resistive switching memory cells

Voltage-time dilemma of pure electronic mechanisms in resistive switching memory cells

10.1063/1.3319591

Crossref journal-article

AIP Publishing

Journal of Applied Physics (317)

Abstract

Metal/insulator/metal thin film stacks showing stable resistive switching are promising candidates for future use as a nonvolatile resistive random access memory, competitive to FLASH and DRAM. Although the switching mechanisms are not completely understood a lot of theories and models try to describe the effects. One of them postulates the trapping and detrapping of electronic charge in immobile traps as the reason for the resistance changes, also known as Simmons & Verderber model. This contribution shows that this “pure electronic” switching mechanism will face a voltage-time dilemma—general to all switching insulators—at conditions competitive to the state-of-the-art FLASH. There is an incompatibility between the long retention time (10 years) and the short READ/WRITE current pulses (tREAD/WRITE≤100 ns) at high densities (area≤100×100 nm2) at low applied voltages (≤1 V). This general dilemma is exemplified in two detailed scenarios with different electronic band and defect properties.

Bibliography

Schroeder, H., Zhirnov, V. V., Cavin, R. K., & Waser, R. (2010). Voltage-time dilemma of pure electronic mechanisms in resistive switching memory cells. Journal of Applied Physics, 107(5).

Authors 4

Herbert Schroeder (first)
Victor V. Zhirnov (additional)
Ralph K. Cavin (additional)
Rainer Waser (additional)

References 13 Referenced 101

{'key': '2023080100232209500_c1', 'first-page': '77', 'volume': 'A301', 'year': '1967', 'journal-title': 'Proc. Roy. Soc.'} / Proc. Roy. Soc. (1967)
10.1063/1.1659895 / J. Appl. Phys. (1971)
10.1103/PhysRevB.70.224403 / Phys. Rev. B (2004)
10.1016/j.tsf.2006.03.031 / Thin Solid Films (2006)
10.1063/1.2783481 / Appl. Phys. Lett. (2007)
10.1063/1.122402 / Appl. Phys. Lett. (1998)
10.1088/0957-4484/10/2/310 / Nanotechnology (1999)
{'first-page': '171', 'volume-title': 'Quantum Mechanics', 'year': '1958', 'key': '2023080100232209500_c7'} / Quantum Mechanics (1958)
{'first-page': '148', 'volume-title': 'Electrical Transport in Solids', 'year': '1981', 'key': '2023080100232209500_c8'} / Electrical Transport in Solids (1981)
10.1016/S0040-6090(96)09508-9 / Thin Solid Films (1997)
{'key': '2023080100232209500_c10', 'first-page': '223', 'volume': '284', 'year': '1995', 'journal-title': 'NATO ASI Ser., Ser. E Appl. Sci.'} / NATO ASI Ser., Ser. E Appl. Sci. (1995)
10.1063/1.1541096 / Appl. Phys. Lett. (2003)
10.1098/rspa.1928.0091 / Proc. R. Soc. London, Ser. A (1928)

Dates

Type	When
Created	15 years, 5 months ago (March 11, 2010, 6:35 p.m.)
Deposited	2 years, 1 month ago (July 31, 2023, 8:23 p.m.)
Indexed	1 month ago (Aug. 1, 2025, 11:58 p.m.)
Issued	15 years, 6 months ago (March 1, 2010)
Published	15 years, 6 months ago (March 1, 2010)
Published Online	15 years, 5 months ago (March 11, 2010)
Published Print	15 years, 6 months ago (March 1, 2010)

Funders 0

None

BibTeX

@article{Schroeder_2010, title={Voltage-time dilemma of pure electronic mechanisms in resistive switching memory cells}, volume={107}, ISSN={1089-7550}, url={http://dx.doi.org/10.1063/1.3319591}, DOI={10.1063/1.3319591}, number={5}, journal={Journal of Applied Physics}, publisher={AIP Publishing}, author={Schroeder, Herbert and Zhirnov, Victor V. and Cavin, Ralph K. and Waser, Rainer}, year={2010}, month=mar }

JSON

{
  "indexed": {
    "date-parts": [
      [
        2025,
        8,
        2
      ]
    ],
    "date-time": "2025-08-02T03:58:46Z",
    "timestamp": 1754107126204,
    "version": "3.41.2"
  },
  "reference-count": 13,
  "publisher": "AIP Publishing",
  "issue": "5",
  "content-domain": {
    "domain": [
      "pubs.aip.org"
    ],
    "crossmark-restriction": true
  },
  "published-print": {
    "date-parts": [
      [
        2010,
        3,
        1
      ]
    ]
  },
  "abstract": "<jats:p>Metal/insulator/metal thin film stacks showing stable resistive switching are promising candidates for future use as a nonvolatile resistive random access memory, competitive to FLASH and DRAM. Although the switching mechanisms are not completely understood a lot of theories and models try to describe the effects. One of them postulates the trapping and detrapping of electronic charge in immobile traps as the reason for the resistance changes, also known as Simmons &amp; Verderber model. This contribution shows that this \u201cpure electronic\u201d switching mechanism will face a voltage-time dilemma\u2014general to all switching insulators\u2014at conditions competitive to the state-of-the-art FLASH. There is an incompatibility between the long retention time (10 years) and the short READ/WRITE current pulses (tREAD/WRITE\u2264100\u2002ns) at high densities (area\u2264100\u00d7100\u2002nm2) at low applied voltages (\u22641\u2002V). This general dilemma is exemplified in two detailed scenarios with different electronic band and defect properties.</jats:p>",
  "DOI": "10.1063/1.3319591",
  "type": "journal-article",
  "created": {
    "date-parts": [
      [
        2010,
        3,
        11
      ]
    ],
    "date-time": "2010-03-11T23:35:05Z",
    "timestamp": 1268350505000
  },
  "update-policy": "https://doi.org/10.1063/aip-crossmark-policy-page",
  "source": "Crossref",
  "is-referenced-by-count": 101,
  "title": "Voltage-time dilemma of pure electronic mechanisms in resistive switching memory cells",
  "prefix": "10.1063",
  "volume": "107",
  "author": [
    {
      "given": "Herbert",
      "family": "Schroeder",
      "sequence": "first",
      "affiliation": [
        {
          "name": "Forschungszentrum J\u00fclich GmbH 1 IEM, Institut f\u00fcr Festk\u00f6rperforschung and JARAFIT\u2014J\u00fclich Aachen Research Alliance Fundamentals of Future Information Technology, , D-52425 J\u00fclich, Germany"
        }
      ]
    },
    {
      "given": "Victor V.",
      "family": "Zhirnov",
      "sequence": "additional",
      "affiliation": [
        {
          "name": "Semiconductor Research Corporation 2 , Durham, North Carolina 27703, USA"
        }
      ]
    },
    {
      "given": "Ralph K.",
      "family": "Cavin",
      "sequence": "additional",
      "affiliation": [
        {
          "name": "Semiconductor Research Corporation 2 , Durham, North Carolina 27703, USA"
        }
      ]
    },
    {
      "given": "Rainer",
      "family": "Waser",
      "sequence": "additional",
      "affiliation": [
        {
          "name": "Forschungszentrum J\u00fclich GmbH 1 IEM, Institut f\u00fcr Festk\u00f6rperforschung and JARAFIT\u2014J\u00fclich Aachen Research Alliance Fundamentals of Future Information Technology, , D-52425 J\u00fclich, Germany"
        }
      ]
    }
  ],
  "member": "317",
  "published-online": {
    "date-parts": [
      [
        2010,
        3,
        11
      ]
    ]
  },
  "reference": [
    {
      "key": "2023080100232209500_c1",
      "first-page": "77",
      "volume": "A301",
      "year": "1967",
      "journal-title": "Proc. Roy. Soc."
    },
    {
      "key": "2023080100232209500_c2",
      "doi-asserted-by": "publisher",
      "first-page": "5076",
      "DOI": "10.1063/1.1659895",
      "volume": "42",
      "year": "1971",
      "journal-title": "J. Appl. Phys."
    },
    {
      "key": "2023080100232209500_c3",
      "doi-asserted-by": "publisher",
      "first-page": "224403",
      "DOI": "10.1103/PhysRevB.70.224403",
      "volume": "70",
      "year": "2004",
      "journal-title": "Phys. Rev. B"
    },
    {
      "key": "2023080100232209500_c4",
      "doi-asserted-by": "publisher",
      "first-page": "2726",
      "DOI": "10.1016/j.tsf.2006.03.031",
      "volume": "515",
      "year": "2006",
      "journal-title": "Thin Solid Films"
    },
    {
      "key": "2023080100232209500_c5",
      "doi-asserted-by": "publisher",
      "first-page": "123506",
      "DOI": "10.1063/1.2783481",
      "volume": "91",
      "year": "2007",
      "journal-title": "Appl. Phys. Lett."
    },
    {
      "key": "2023080100232209500_c6a",
      "doi-asserted-by": "publisher",
      "first-page": "2137",
      "DOI": "10.1063/1.122402",
      "volume": "73",
      "year": "1998",
      "journal-title": "Appl. Phys. Lett."
    },
    {
      "key": "2023080100232209500_c6c",
      "doi-asserted-by": "publisher",
      "first-page": "159",
      "DOI": "10.1088/0957-4484/10/2/310",
      "volume": "10",
      "year": "1999",
      "journal-title": "Nanotechnology"
    },
    {
      "first-page": "171",
      "volume-title": "Quantum Mechanics",
      "year": "1958",
      "key": "2023080100232209500_c7"
    },
    {
      "first-page": "148",
      "volume-title": "Electrical Transport in Solids",
      "year": "1981",
      "key": "2023080100232209500_c8"
    },
    {
      "key": "2023080100232209500_c9",
      "doi-asserted-by": "publisher",
      "first-page": "66",
      "DOI": "10.1016/S0040-6090(96)09508-9",
      "volume": "305",
      "year": "1997",
      "journal-title": "Thin Solid Films"
    },
    {
      "key": "2023080100232209500_c10",
      "first-page": "223",
      "volume": "284",
      "year": "1995",
      "journal-title": "NATO ASI Ser., Ser. E Appl. Sci."
    },
    {
      "key": "2023080100232209500_c11",
      "doi-asserted-by": "publisher",
      "first-page": "781",
      "DOI": "10.1063/1.1541096",
      "volume": "82",
      "year": "2003",
      "journal-title": "Appl. Phys. Lett."
    },
    {
      "key": "2023080100232209500_c12",
      "doi-asserted-by": "publisher",
      "first-page": "173",
      "DOI": "10.1098/rspa.1928.0091",
      "volume": "119",
      "year": "1928",
      "journal-title": "Proc. R. Soc. London, Ser. A"
    }
  ],
  "container-title": "Journal of Applied Physics",
  "original-title": [],
  "language": "en",
  "link": [
    {
      "URL": "https://pubs.aip.org/aip/jap/article-pdf/doi/10.1063/1.3319591/15058241/054517_1_online.pdf",
      "content-type": "application/pdf",
      "content-version": "vor",
      "intended-application": "syndication"
    },
    {
      "URL": "https://pubs.aip.org/aip/jap/article-pdf/doi/10.1063/1.3319591/15058241/054517_1_online.pdf",
      "content-type": "unspecified",
      "content-version": "vor",
      "intended-application": "similarity-checking"
    }
  ],
  "deposited": {
    "date-parts": [
      [
        2023,
        8,
        1
      ]
    ],
    "date-time": "2023-08-01T00:23:29Z",
    "timestamp": 1690849409000
  },
  "score": 1,
  "resource": {
    "primary": {
      "URL": "https://pubs.aip.org/jap/article/107/5/054517/906894/Voltage-time-dilemma-of-pure-electronic-mechanisms"
    }
  },
  "subtitle": [],
  "short-title": [],
  "issued": {
    "date-parts": [
      [
        2010,
        3,
        1
      ]
    ]
  },
  "references-count": 13,
  "journal-issue": {
    "issue": "5",
    "published-print": {
      "date-parts": [
        [
          2010,
          3,
          1
        ]
      ]
    }
  },
  "URL": "http://dx.doi.org/10.1063/1.3319591",
  "relation": {},
  "ISSN": [
    "0021-8979",
    "1089-7550"
  ],
  "subject": [],
  "published-other": {
    "date-parts": [
      [
        2010,
        3,
        1
      ]
    ]
  },
  "published": {
    "date-parts": [
      [
        2010,
        3,
        1
      ]
    ]
  },
  "article-number": "054517"
}