Crossref journal-article
AIP Publishing
Journal of Applied Physics (317)
Abstract

Field ion microscopy and atom-probe mass spectroscopy of insulating glasses are reported for the first time. Procedures for preparing, field ion imaging, and atom-probe mass analyzing samples of pyrex (Corning 7740 glass) and fused quartz are presented.

Bibliography

Kellogg, G. L. (1982). Field ion microscopy and pulsed laser atom-probe mass spectroscopy of insulating glasses. Journal of Applied Physics, 53(9), 6383–6386.

Authors 1
  1. G. L. Kellogg (first)
References 17 Referenced 33
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Dates
Type When
Created 22 years, 6 months ago (Feb. 14, 2003, 6:21 p.m.)
Deposited 1 year, 6 months ago (Feb. 4, 2024, 8:15 p.m.)
Indexed 1 month ago (July 16, 2025, 9:50 a.m.)
Issued 42 years, 11 months ago (Sept. 1, 1982)
Published 42 years, 11 months ago (Sept. 1, 1982)
Published Print 42 years, 11 months ago (Sept. 1, 1982)
Funders 0

None

@article{Kellogg_1982, title={Field ion microscopy and pulsed laser atom-probe mass spectroscopy of insulating glasses}, volume={53}, ISSN={1089-7550}, url={http://dx.doi.org/10.1063/1.331509}, DOI={10.1063/1.331509}, number={9}, journal={Journal of Applied Physics}, publisher={AIP Publishing}, author={Kellogg, G. L.}, year={1982}, month=sep, pages={6383–6386} }