Abstract
It is demonstrated that lattice-mismatched InxGa1−xAs (x = 0.77) can be grown by molecular beam epitaxy on InP substrates with mobilities and photoluminescence (PL) intensities comparable to those of the lattice-matched InxGa1−xAs (x = 0.53). This was accomplished using a graded buffer layer and superlattice dislocation barrier between the substrate and the In0.77Ga0.23As layer. The lattice-mismatched layers have Hall mobilities of 7000–8000 cm2/V sec at room temperature and photoluminescence intensities at liquid nitrogen temperature of 1/2–1/3 of that from the lattice-matched InxGa1−xAs. We also found that the conventional AB etch is not a reliable guide to the electrical and optical qualities of InGaAs layers.
References
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Dates
Type | When |
---|---|
Created | 22 years, 6 months ago (Feb. 14, 2003, 6:21 p.m.) |
Deposited | 1 year, 7 months ago (Feb. 4, 2024, 7:29 p.m.) |
Indexed | 1 year, 2 months ago (July 5, 2024, 5:15 p.m.) |
Issued | 43 years, 7 months ago (Feb. 1, 1982) |
Published | 43 years, 7 months ago (Feb. 1, 1982) |
Published Print | 43 years, 7 months ago (Feb. 1, 1982) |
@article{Chai_1982, title={Molecular beam epitaxial growth of lattice-mismatched In0.77Ga0.23As on InP}, volume={53}, ISSN={1089-7550}, url={http://dx.doi.org/10.1063/1.330534}, DOI={10.1063/1.330534}, number={2}, journal={Journal of Applied Physics}, publisher={AIP Publishing}, author={Chai, Young G. and Chow, Robert}, year={1982}, month=feb, pages={1229–1232} }