DOI: 10.1063/1.328488. Generalized Hall-effect measurement geometries and limitations of van der Pauw-type Hall-effect measurements

Generalized Hall-effect measurement geometries and limitations of van der Pauw-type Hall-effect measurements

10.1063/1.328488

Crossref journal-article

AIP Publishing

Journal of Applied Physics (317)

Abstract

A rigorous derivation is given to generalize the allowed, Hall effect, sample shapes from the restrictive, rectangular parallelepiped configurations to a much more general class of geometries characterized by mirror symmetry for materials whose mobile carriers have surfaces of constant energy in k̄ space that are well described by ellipsoids. However, this mirror symmetry condition is more restrictive than the almost arbitrary sample shapes proposed with the van der Pauw technique for thin films. Experimental data taken on n-type CdS at liquid-nitrogen temperatures in magnetic field strengths of 8 and 145 kG show that errors ranging from 1 to 600% can result from van der Pauw-type geometries depending on how much the sample shape and/or contact arrangement differs from the mirror symmetry. An empirically derived averaging technique is described that reduces the observed errors to less than 13% even with van der Pauw-type shapes that do not meet the mirror symmetry conditions.

Bibliography

Boerger, D. M., Kramer, J. J., & Partain, L. D. (1981). Generalized Hall-effect measurement geometries and limitations of van der Pauw-type Hall-effect measurements. Journal of Applied Physics, 52(1), 269â274.

Authors 3

Daniel M. Boerger (first)
John J. Kramer (additional)
Larry D. Partain (additional)

References 13 Referenced 14

10.1103/PhysRev.99.1799 / Phys. Rev. (1955)
10.1063/1.322738 / J. Appl. Phys. (1976)
10.1063/1.323975 / J. Appl. Phys. (1977)
10.1143/JPSJ.15.1924 / J. Phys. Soc. Jpn. (1960)
{'key': '2024020423160164800_r5', 'first-page': '1', 'volume': '13', 'year': '1958', 'journal-title': 'Philips Res. Rep.'} / Philips Res. Rep. (1958)
10.1016/0038-1101(74)90001-X / Solid State Electron. (1974)
10.1109/JRPROC.1958.286957 / IRE (1958)
10.1063/1.325652 / J. Appl. Phys. (1979)
{'key': '2024020423160164800_r9', 'first-page': '1414', 'volume': '42', 'year': '1954', 'journal-title': 'Proc. IRE'} / Proc. IRE (1954)
{'key': '2024020423160164800_r10'}
{'key': '2024020423160164800_r11'}
{'key': '2024020423160164800_r12'}
10.1103/PhysRevB.21.2432 / Phys. Rev. B (1980)

Dates

Type	When
Created	22 years, 6 months ago (Feb. 14, 2003, 5:56 p.m.)
Deposited	1 year, 6 months ago (Feb. 4, 2024, 6:16 p.m.)
Indexed	1 year, 6 months ago (Feb. 5, 2024, 12:22 a.m.)
Issued	44 years, 7 months ago (Jan. 1, 1981)
Published	44 years, 7 months ago (Jan. 1, 1981)
Published Print	44 years, 7 months ago (Jan. 1, 1981)

Funders 0

None

BibTeX

@article{Boerger_1981, title={Generalized Hall-effect measurement geometries and limitations of van der Pauw-type Hall-effect measurements}, volume={52}, ISSN={1089-7550}, url={http://dx.doi.org/10.1063/1.328488}, DOI={10.1063/1.328488}, number={1}, journal={Journal of Applied Physics}, publisher={AIP Publishing}, author={Boerger, Daniel M. and Kramer, John J. and Partain, Larry D.}, year={1981}, month=jan, pages={269–274} }

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