Abstract
Transport properties of Alx Ga1−x As layers having AlAs mole fractions between 0.17 and 0.375 and grown by molecular beam epitaxy were investigated. The Al cell temperature was kept at 1075 °C while the Ga cell temperature was changed between 910 and 950 °C to obtain the aforementioned AlAs mole fractions. The donor levels of Sn in Alx Ga1−x As obtained from the temperature dependence of the net donor concentration are below 3, 30, and 40 meV for x=0.17, x=0.29, and x=0.375, respectively. Al0.22 Ga0.78 As layers having a net electron concentration of about 1.7×1018 cm−3 and grown at 630 °C exhibited a mobility of 868 and 1095 cm2/V sec at 300 and 78 °K, respectively. The mobility was found to be strongly dependent on the substrate temperature during the growth. The lower substrate temperatures resulted in lower electron mobility.
References
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Dates
Type | When |
---|---|
Created | 22 years, 6 months ago (Feb. 14, 2003, 5:37 p.m.) |
Deposited | 1 year, 6 months ago (Feb. 4, 2024, 6:04 p.m.) |
Indexed | 1 year, 6 months ago (Feb. 5, 2024, 9:25 a.m.) |
Issued | 45 years ago (Sept. 1, 1980) |
Published | 45 years ago (Sept. 1, 1980) |
Published Print | 45 years ago (Sept. 1, 1980) |
@article{Morko__1980, title={Transport properties of Sn-doped AlxGa1−xAs grown by molecular beam epitaxy}, volume={51}, ISSN={1089-7550}, url={http://dx.doi.org/10.1063/1.328324}, DOI={10.1063/1.328324}, number={9}, journal={Journal of Applied Physics}, publisher={AIP Publishing}, author={Morkoç, Hadis and Cho, A. Y. and Radice, C.}, year={1980}, month=sep, pages={4882–4884} }