DOI: 10.1063/1.328237. Electron-electron interaction and screening effects in hot electron transport in GaAs

Electron-electron interaction and screening effects in hot electron transport in GaAs

10.1063/1.328237

Crossref journal-article

AIP Publishing

Journal of Applied Physics (317)

Abstract

The influence of electron-electron scattering processes on high-field transport properties of electrons in GaAs, and the usefulness of a drifted Maxwellian approximation to the distribution function in analysis of devices in which these effects are important, have been studied. Monte Carlo simulations of transport both with and without electron-electron scattering included are compared with drifted Maxwellian distribution functions over a range of doping and electric field values typical of submicron-scale devices. Electron-electron scattering is found to have a significant effect on the shape of the distribution function derived by MC simulation, but little effect on the average electron velocity. The degree of approximation involved in device analyses when the drifted Maxwellian is used instead of the correct distribution function is discussed.

Bibliography

Inoue, M., & Frey, J. (1980). Electron-electron interaction and screening effects in hot electron transport in GaAs. Journal of Applied Physics, 51(8), 4234â4239.

Authors 2

Masataka Inoue (first)
Jeffrey Frey (additional)

References 11 Referenced 14

10.1088/0370-1328/86/6/306 / Proc. Phys. Soc. (1965)
{'key': '2024020422560356200_r2'}
{'key': '2024020422560356200_r3', 'first-page': '424', 'volume': '21', 'year': '1966', 'journal-title': 'J. Phys. Soc. Jpn.'} / J. Phys. Soc. Jpn. (1966)
10.1016/0038-1101(78)90109-0 / Solid State Electron. (1978)
10.1088/0370-1328/86/4/328 / Proc. Phys. Soc. (1965)
10.1016/0038-1098(75)90131-3 / Solid State Commun. (1975)
10.1143/JPSJ.47.861 / J. Phys. Soc. Jpn. (1979)
10.1103/PhysRev.92.609 / Phys. Rev. (1953)
10.1016/0022-3697(70)90001-6 / J. Phys. Chem. Solids (1970)
10.1063/1.325366 / J. Appl. Phys. (1978)
{'key': '2024020422560356200_r11', 'first-page': '406', 'volume': '256', 'year': '1958', 'journal-title': 'Proc. R. Soc. London Ser. A'} / Proc. R. Soc. London Ser. A (1958)

Dates

Type	When
Created	22 years, 6 months ago (Feb. 14, 2003, 5:37 p.m.)
Deposited	1 year, 6 months ago (Feb. 4, 2024, 5:56 p.m.)
Indexed	1 year, 6 months ago (Feb. 5, 2024, 10:05 a.m.)
Issued	45 years ago (Aug. 1, 1980)
Published	45 years ago (Aug. 1, 1980)
Published Print	45 years ago (Aug. 1, 1980)

Funders 0

None

BibTeX

@article{Inoue_1980, title={Electron-electron interaction and screening effects in hot electron transport in GaAs}, volume={51}, ISSN={1089-7550}, url={http://dx.doi.org/10.1063/1.328237}, DOI={10.1063/1.328237}, number={8}, journal={Journal of Applied Physics}, publisher={AIP Publishing}, author={Inoue, Masataka and Frey, Jeffrey}, year={1980}, month=aug, pages={4234–4239} }

JSON

{
  "indexed": {
    "date-parts": [
      [
        2024,
        2,
        5
      ]
    ],
    "date-time": "2024-02-05T15:05:41Z",
    "timestamp": 1707145541152
  },
  "reference-count": 11,
  "publisher": "AIP Publishing",
  "issue": "8",
  "content-domain": {
    "domain": [
      "pubs.aip.org"
    ],
    "crossmark-restriction": true
  },
  "published-print": {
    "date-parts": [
      [
        1980,
        8,
        1
      ]
    ]
  },
  "abstract": "<jats:p>The influence of electron-electron scattering processes on high-field transport properties of electrons in GaAs, and the usefulness of a drifted Maxwellian approximation to the distribution function in analysis of devices in which these effects are important, have been studied. Monte Carlo simulations of transport both with and without electron-electron scattering included are compared with drifted Maxwellian distribution functions over a range of doping and electric field values typical of submicron-scale devices. Electron-electron scattering is found to have a significant effect on the shape of the distribution function derived by MC simulation, but little effect on the average electron velocity. The degree of approximation involved in device analyses when the drifted Maxwellian is used instead of the correct distribution function is discussed.</jats:p>",
  "DOI": "10.1063/1.328237",
  "type": "journal-article",
  "created": {
    "date-parts": [
      [
        2003,
        2,
        14
      ]
    ],
    "date-time": "2003-02-14T22:37:18Z",
    "timestamp": 1045262238000
  },
  "page": "4234-4239",
  "update-policy": "http://dx.doi.org/10.1063/aip-crossmark-policy-page",
  "source": "Crossref",
  "is-referenced-by-count": 14,
  "title": "Electron-electron interaction and screening effects in hot electron transport in GaAs",
  "prefix": "10.1063",
  "volume": "51",
  "author": [
    {
      "given": "Masataka",
      "family": "Inoue",
      "sequence": "first",
      "affiliation": [
        {
          "name": "School of Electrical Engineering, Cornell University, Ithaca, New York 14853"
        }
      ]
    },
    {
      "given": "Jeffrey",
      "family": "Frey",
      "sequence": "additional",
      "affiliation": [
        {
          "name": "School of Electrical Engineering, Cornell University, Ithaca, New York 14853"
        }
      ]
    }
  ],
  "member": "317",
  "reference": [
    {
      "key": "2024020422560356200_r1",
      "doi-asserted-by": "crossref",
      "first-page": "1205",
      "DOI": "10.1088/0370-1328/86/6/306",
      "volume": "86",
      "year": "1965",
      "journal-title": "Proc. Phys. Soc."
    },
    {
      "key": "2024020422560356200_r2"
    },
    {
      "key": "2024020422560356200_r3",
      "first-page": "424",
      "volume": "21",
      "year": "1966",
      "journal-title": "J. Phys. Soc. Jpn."
    },
    {
      "key": "2024020422560356200_r4",
      "doi-asserted-by": "crossref",
      "first-page": "9",
      "DOI": "10.1016/0038-1101(78)90109-0",
      "volume": "21",
      "year": "1978",
      "journal-title": "Solid State Electron."
    },
    {
      "key": "2024020422560356200_r5",
      "doi-asserted-by": "crossref",
      "first-page": "881",
      "DOI": "10.1088/0370-1328/86/4/328",
      "volume": "86",
      "year": "1965",
      "journal-title": "Proc. Phys. Soc."
    },
    {
      "key": "2024020422560356200_r6",
      "doi-asserted-by": "crossref",
      "first-page": "1133",
      "DOI": "10.1016/0038-1098(75)90131-3",
      "volume": "16",
      "year": "1975",
      "journal-title": "Solid State Commun."
    },
    {
      "key": "2024020422560356200_r7",
      "doi-asserted-by": "crossref",
      "first-page": "861",
      "DOI": "10.1143/JPSJ.47.861",
      "volume": "47",
      "year": "1979",
      "journal-title": "J. Phys. Soc. Jpn."
    },
    {
      "key": "2024020422560356200_r8",
      "doi-asserted-by": "crossref",
      "first-page": "609",
      "DOI": "10.1103/PhysRev.92.609",
      "volume": "92",
      "year": "1953",
      "journal-title": "Phys. Rev."
    },
    {
      "key": "2024020422560356200_r9",
      "doi-asserted-by": "crossref",
      "first-page": "1963",
      "DOI": "10.1016/0022-3697(70)90001-6",
      "volume": "31",
      "year": "1970",
      "journal-title": "J. Phys. Chem. Solids"
    },
    {
      "key": "2024020422560356200_r10",
      "doi-asserted-by": "crossref",
      "first-page": "4064",
      "DOI": "10.1063/1.325366",
      "volume": "49",
      "year": "1978",
      "journal-title": "J. Appl. Phys."
    },
    {
      "key": "2024020422560356200_r11",
      "first-page": "406",
      "volume": "256",
      "year": "1958",
      "journal-title": "Proc. R. Soc. London Ser. A"
    }
  ],
  "container-title": "Journal of Applied Physics",
  "original-title": [],
  "language": "en",
  "link": [
    {
      "URL": "https://pubs.aip.org/aip/jap/article-pdf/51/8/4234/18389051/4234_1_online.pdf",
      "content-type": "application/pdf",
      "content-version": "vor",
      "intended-application": "syndication"
    },
    {
      "URL": "https://pubs.aip.org/aip/jap/article-pdf/51/8/4234/18389051/4234_1_online.pdf",
      "content-type": "unspecified",
      "content-version": "vor",
      "intended-application": "similarity-checking"
    }
  ],
  "deposited": {
    "date-parts": [
      [
        2024,
        2,
        4
      ]
    ],
    "date-time": "2024-02-04T22:56:12Z",
    "timestamp": 1707087372000
  },
  "score": 1,
  "resource": {
    "primary": {
      "URL": "https://pubs.aip.org/jap/article/51/8/4234/10284/Electron-electron-interaction-and-screening"
    }
  },
  "subtitle": [],
  "short-title": [],
  "issued": {
    "date-parts": [
      [
        1980,
        8,
        1
      ]
    ]
  },
  "references-count": 11,
  "journal-issue": {
    "issue": "8",
    "published-print": {
      "date-parts": [
        [
          1980,
          8,
          1
        ]
      ]
    }
  },
  "URL": "http://dx.doi.org/10.1063/1.328237",
  "relation": {},
  "ISSN": [
    "0021-8979",
    "1089-7550"
  ],
  "subject": [],
  "published-other": {
    "date-parts": [
      [
        1980,
        8
      ]
    ]
  },
  "published": {
    "date-parts": [
      [
        1980,
        8,
        1
      ]
    ]
  }
}