DOI: 10.1063/1.327703. High precision depth profiling of light isotopes in low-atomic-mass solids

High precision depth profiling of light isotopes in low-atomic-mass solids

10.1063/1.327703

Crossref journal-article

AIP Publishing

Journal of Applied Physics (317)

Abstract

An elastic recoil detection technique has been developed to depth profile light isotopes (A≲35) in low-atomic-mass solids (A≲16). It utilizes the maximum-scattering-angle property rather than an absorber to reduce background, with resultant depth precision of about ±2 μg/cm2 (100 Å). The sensitivity is ?5×1016 atoms/cm2 for isotopes lighter than the substrate and ?1015 atoms/cm2 for heavier ones.

Bibliography

Ross, G., & Terreault, B. (1980). High precision depth profiling of light isotopes in low-atomic-mass solids. Journal of Applied Physics, 51(2), 1259â1261.

Authors 2

G. Ross (first)
B. Terreault (additional)

References 8 Referenced 17

10.1021/ba-1976-0158.ch011 / Adv. Chem. (1976)
{'key': '2024020422381378900_r2'}
10.1063/1.322288 / J. Appl. Phys. (1976)
10.1021/ba-1976-0158.ch013 / Adv. Chem. (1976)
{'key': '2024020422381378900_r4'}
{'key': '2024020422381378900_r5'}
10.1063/1.90654 / Appl. Phys. Lett. (1979)
10.1088/0034-4885/18/1/301 / Rep. Prog. Phys. (1955)

Dates

Type	When
Created	22 years, 6 months ago (Feb. 14, 2003, 5:37 p.m.)
Deposited	1 year, 6 months ago (Feb. 4, 2024, 5:38 p.m.)
Indexed	1 year, 6 months ago (Feb. 4, 2024, 6:10 p.m.)
Issued	45 years, 6 months ago (Feb. 1, 1980)
Published	45 years, 6 months ago (Feb. 1, 1980)
Published Print	45 years, 6 months ago (Feb. 1, 1980)

Funders 0

None

BibTeX

@article{Ross_1980, title={High precision depth profiling of light isotopes in low-atomic-mass solids}, volume={51}, ISSN={1089-7550}, url={http://dx.doi.org/10.1063/1.327703}, DOI={10.1063/1.327703}, number={2}, journal={Journal of Applied Physics}, publisher={AIP Publishing}, author={Ross, G. and Terreault, B.}, year={1980}, month=feb, pages={1259–1261} }

JSON

{
  "indexed": {
    "date-parts": [
      [
        2024,
        2,
        4
      ]
    ],
    "date-time": "2024-02-04T23:10:09Z",
    "timestamp": 1707088209962
  },
  "reference-count": 8,
  "publisher": "AIP Publishing",
  "issue": "2",
  "content-domain": {
    "domain": [
      "pubs.aip.org"
    ],
    "crossmark-restriction": true
  },
  "published-print": {
    "date-parts": [
      [
        1980,
        2,
        1
      ]
    ]
  },
  "abstract": "<jats:p>An elastic recoil detection technique has been developed to depth profile light isotopes (A\u227235) in low-atomic-mass solids (A\u227216). It utilizes the maximum-scattering-angle property rather than an absorber to reduce background, with resultant depth precision of about \u00b12 \u03bcg/cm2 (100 \u00c5). The sensitivity is ?5\u00d71016 atoms/cm2 for isotopes lighter than the substrate and ?1015 atoms/cm2 for heavier ones.</jats:p>",
  "DOI": "10.1063/1.327703",
  "type": "journal-article",
  "created": {
    "date-parts": [
      [
        2003,
        2,
        14
      ]
    ],
    "date-time": "2003-02-14T22:37:18Z",
    "timestamp": 1045262238000
  },
  "page": "1259-1261",
  "update-policy": "http://dx.doi.org/10.1063/aip-crossmark-policy-page",
  "source": "Crossref",
  "is-referenced-by-count": 17,
  "title": "High precision depth profiling of light isotopes in low-atomic-mass solids",
  "prefix": "10.1063",
  "volume": "51",
  "author": [
    {
      "given": "G.",
      "family": "Ross",
      "sequence": "first",
      "affiliation": [
        {
          "name": "Centre de Recherches de l'Energie, Universit\u00e9 du Qu\u00e9bec, C.P. 1020, Varennes, Qu\u00e9bec, JOL 2PO, Canada"
        }
      ]
    },
    {
      "given": "B.",
      "family": "Terreault",
      "sequence": "additional",
      "affiliation": [
        {
          "name": "Centre de Recherches de l'Energie, Universit\u00e9 du Qu\u00e9bec, C.P. 1020, Varennes, Qu\u00e9bec, JOL 2PO, Canada"
        }
      ]
    }
  ],
  "member": "317",
  "reference": [
    {
      "key": "2024020422381378900_r1",
      "doi-asserted-by": "crossref",
      "first-page": "262",
      "DOI": "10.1021/ba-1976-0158.ch011",
      "volume": "158",
      "year": "1976",
      "journal-title": "Adv. Chem."
    },
    {
      "key": "2024020422381378900_r2"
    },
    {
      "key": "2024020422381378900_r3",
      "doi-asserted-by": "crossref",
      "first-page": "381",
      "DOI": "10.1063/1.322288",
      "volume": "47",
      "year": "1976",
      "journal-title": "J. Appl. Phys."
    },
    {
      "key": "2024020422381378900_r3a",
      "doi-asserted-by": "crossref",
      "first-page": "295",
      "DOI": "10.1021/ba-1976-0158.ch013",
      "volume": "158",
      "year": "1976",
      "journal-title": "Adv. Chem."
    },
    {
      "key": "2024020422381378900_r4"
    },
    {
      "key": "2024020422381378900_r5"
    },
    {
      "key": "2024020422381378900_r6",
      "doi-asserted-by": "crossref",
      "first-page": "811",
      "DOI": "10.1063/1.90654",
      "volume": "34",
      "year": "1979",
      "journal-title": "Appl. Phys. Lett."
    },
    {
      "key": "2024020422381378900_r7",
      "doi-asserted-by": "crossref",
      "first-page": "1",
      "DOI": "10.1088/0034-4885/18/1/301",
      "volume": "18",
      "year": "1955",
      "journal-title": "Rep. Prog. Phys."
    }
  ],
  "container-title": "Journal of Applied Physics",
  "original-title": [],
  "language": "en",
  "link": [
    {
      "URL": "https://pubs.aip.org/aip/jap/article-pdf/51/2/1259/18387784/1259_1_online.pdf",
      "content-type": "application/pdf",
      "content-version": "vor",
      "intended-application": "syndication"
    },
    {
      "URL": "https://pubs.aip.org/aip/jap/article-pdf/51/2/1259/18387784/1259_1_online.pdf",
      "content-type": "unspecified",
      "content-version": "vor",
      "intended-application": "similarity-checking"
    }
  ],
  "deposited": {
    "date-parts": [
      [
        2024,
        2,
        4
      ]
    ],
    "date-time": "2024-02-04T22:38:23Z",
    "timestamp": 1707086303000
  },
  "score": 1,
  "resource": {
    "primary": {
      "URL": "https://pubs.aip.org/jap/article/51/2/1259/501050/High-precision-depth-profiling-of-light-isotopes"
    }
  },
  "subtitle": [],
  "short-title": [],
  "issued": {
    "date-parts": [
      [
        1980,
        2,
        1
      ]
    ]
  },
  "references-count": 8,
  "journal-issue": {
    "issue": "2",
    "published-print": {
      "date-parts": [
        [
          1980,
          2,
          1
        ]
      ]
    }
  },
  "URL": "http://dx.doi.org/10.1063/1.327703",
  "relation": {},
  "ISSN": [
    "0021-8979",
    "1089-7550"
  ],
  "subject": [],
  "published-other": {
    "date-parts": [
      [
        1980,
        2
      ]
    ]
  },
  "published": {
    "date-parts": [
      [
        1980,
        2,
        1
      ]
    ]
  }
}