Abstract
Reliable and reproducible resistive switching behaviors were observed in graphene oxide (GO) thin films prepared by the vacuum filtration method. The Cu/GO/Pt structure showed an on/off ratio of about 20, a retention time of more than 104 s, and switching threshold voltages of less than 1 V. The switching effect could be understood by considering the desorption/absorption of oxygen-related groups on the GO sheets as well as the diffusion of the top electrodes. Our experiments indicate that GO is potentially useful for future nonvolatile memory applications.
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Dates
Type | When |
---|---|
Created | 15 years, 8 months ago (Dec. 7, 2009, 10:13 p.m.) |
Deposited | 2 years, 2 months ago (June 23, 2023, 2:12 a.m.) |
Indexed | 1 month, 1 week ago (July 30, 2025, 6:53 a.m.) |
Issued | 15 years, 8 months ago (Dec. 7, 2009) |
Published | 15 years, 8 months ago (Dec. 7, 2009) |
Published Online | 15 years, 8 months ago (Dec. 7, 2009) |
Published Print | 15 years, 8 months ago (Dec. 7, 2009) |
@article{He_2009, title={Nonvolatile resistive switching in graphene oxide thin films}, volume={95}, ISSN={1077-3118}, url={http://dx.doi.org/10.1063/1.3271177}, DOI={10.1063/1.3271177}, number={23}, journal={Applied Physics Letters}, publisher={AIP Publishing}, author={He, C. L. and Zhuge, F. and Zhou, X. F. and Li, M. and Zhou, G. C. and Liu, Y. W. and Wang, J. Z. and Chen, B. and Su, W. J. and Liu, Z. P. and Wu, Y. H. and Cui, P. and Li, Run-Wei}, year={2009}, month=dec }