DOI: 10.1063/1.3265946. Robust atomic resolution imaging of light elements using scanning transmission electron microscopy

Robust atomic resolution imaging of light elements using scanning transmission electron microscopy

10.1063/1.3265946

Crossref journal-article

AIP Publishing

Applied Physics Letters (317)

Abstract

We show that an annular detector placed within the bright field cone in scanning transmission electron microscopy allows direct imaging of light elements in crystals. In contrast to common high angle annular dark field imaging, both light and heavy atom columns are visible simultaneously. In contrast to common bright field imaging, the images are directly and robustly interpretable over a large range of thicknesses. We demonstrate this through systematic simulations and present a simple physical model to obtain some insight into the scattering dynamics.

Bibliography

Findlay, S. D., Shibata, N., Sawada, H., Okunishi, E., Kondo, Y., Yamamoto, T., & Ikuhara, Y. (2009). Robust atomic resolution imaging of light elements using scanning transmission electron microscopy. Applied Physics Letters, 95(19).

Authors 7

S. D. Findlay (first)
N. Shibata (additional)
H. Sawada (additional)
E. Okunishi (additional)
Y. Kondo (additional)
T. Yamamoto (additional)
Y. Ikuhara (additional)

References 14 Referenced 344

10.1103/PhysRevLett.69.3743 / Phys. Rev. Lett. (1992)
10.1126/science.1093617 / Science (2004)
10.1103/PhysRevLett.95.225506 / Phys. Rev. Lett. (2005)
10.1038/nmat2407 / Nature Mater. (2009)
10.1146/annurev.matsci.35.102103.090513 / Annu. Rev. Mater. Res (2005)
10.1126/science.1124511 / Science (2006)
10.1103/PhysRevLett.99.086102 / Phys. Rev. Lett. (2007)
10.1038/nature06352 / Nature (London) (2007)
10.1126/science.1148820 / Science (2008)
10.1017/S1431927609093891 / Microsc. Microanal. (2009)
10.1016/0304-3991(96)00008-3 / Ultramicroscopy (1996)
{'key': '2023062500580177600_c12', 'first-page': '111', 'volume-title': 'Advances in Imaging and Electron Physics', 'author': 'Hawkes', 'year': '2005'} / Advances in Imaging and Electron Physics by Hawkes (2005)
10.1080/01418617808239233 / Philos. Mag. A (1978)
10.1016/S0304-3991(02)00341-8 / Ultramicroscopy (2003)

Dates

Type	When
Created	15 years, 9 months ago (Nov. 16, 2009, 1:49 p.m.)
Deposited	2 years, 2 months ago (June 25, 2023, 1:28 a.m.)
Indexed	1 week, 1 day ago (Aug. 23, 2025, 1:05 a.m.)
Issued	15 years, 9 months ago (Nov. 9, 2009)
Published	15 years, 9 months ago (Nov. 9, 2009)
Published Online	15 years, 9 months ago (Nov. 13, 2009)
Published Print	15 years, 9 months ago (Nov. 9, 2009)

Funders 0

None

BibTeX

@article{Findlay_2009, title={Robust atomic resolution imaging of light elements using scanning transmission electron microscopy}, volume={95}, ISSN={1077-3118}, url={http://dx.doi.org/10.1063/1.3265946}, DOI={10.1063/1.3265946}, number={19}, journal={Applied Physics Letters}, publisher={AIP Publishing}, author={Findlay, S. D. and Shibata, N. and Sawada, H. and Okunishi, E. and Kondo, Y. and Yamamoto, T. and Ikuhara, Y.}, year={2009}, month=nov }

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