DOI: 10.1063/1.325845. X-ray total-external-reflection–Bragg diffraction: A structural study of the GaAs-Al interface

X-ray total-external-reflection–Bragg diffraction: A structural study of the GaAs-Al interface

10.1063/1.325845

Crossref journal-article

AIP Publishing

Journal of Applied Physics (317)

Abstract

A new technique utilizing conventional x-ray diffraction in conjunction with total external reflection has provided a powerful tool for studying ordered interfaces and surface phenomena. It has been used in this work to study the details of the interface region of a molecular beam epitaxially grown Al single crystal on a molecular beam epitaxially grown GaAs single-crystal substrate. A simple model including variations of the lattice parameter and disorder in the interface region is in agreement with these experimental results.

Bibliography

Marra, W. C., Eisenberger, P., & Cho, A. Y. (1979). X-ray total-external-reflectionâBragg diffraction: A structural study of the GaAs-Al interface. Journal of Applied Physics, 50(11), 6927â6933.

Authors 3

W. C. Marra (first)
P. Eisenberger (additional)
A. Y. Cho (additional)

References 7 Referenced 520

10.1080/14786442308634208 / Philos. Mag. (1923)
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10.1063/1.325286 / J. Appl. Phys. (1978)
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Dates

Type	When
Created	22 years, 6 months ago (Feb. 14, 2003, 5:07 p.m.)
Deposited	1 year, 6 months ago (Feb. 4, 2024, 5 p.m.)
Indexed	1 week, 3 days ago (Aug. 19, 2025, 6:05 a.m.)
Issued	45 years, 9 months ago (Nov. 1, 1979)
Published	45 years, 9 months ago (Nov. 1, 1979)
Published Print	45 years, 9 months ago (Nov. 1, 1979)

Funders 0

None

BibTeX

@article{Marra_1979, title={X-ray total-external-reflection–Bragg diffraction: A structural study of the GaAs-Al interface}, volume={50}, ISSN={1089-7550}, url={http://dx.doi.org/10.1063/1.325845}, DOI={10.1063/1.325845}, number={11}, journal={Journal of Applied Physics}, publisher={AIP Publishing}, author={Marra, W. C. and Eisenberger, P. and Cho, A. Y.}, year={1979}, month=nov, pages={6927–6933} }

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