Abstract
We report an anisotropic misfit stress relief mechanism in thin La0.67Sr0.33MnO3 (LSMO) films coherently grown on NdGaO3(110) substrates. These results are uniquely related to the orthorhombicity of the LSMO. The x-ray diffraction measurements and quantitative simulations demonstrate that biaxial mismatch stress is relieved differently along in-plane directions perpendicular to each other: in the [11¯0] direction stress is accommodated by decrease of the γ angle of the orthorhombic LSMO unit cell, while in the [001] direction stress is partially relieved by periodic lattice modulations.
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Dates
Type | When |
---|---|
Created | 15 years, 10 months ago (Oct. 14, 2009, 6:23 p.m.) |
Deposited | 2 years, 1 month ago (June 30, 2023, 10:45 p.m.) |
Indexed | 3 weeks, 6 days ago (July 30, 2025, 6:53 a.m.) |
Issued | 15 years, 10 months ago (Oct. 12, 2009) |
Published | 15 years, 10 months ago (Oct. 12, 2009) |
Published Online | 15 years, 10 months ago (Oct. 14, 2009) |
Published Print | 15 years, 10 months ago (Oct. 12, 2009) |
@article{Vailionis_2009, title={Anisotropic stress relief mechanism in epitaxial La0.67Sr0.33MnO3 films}, volume={95}, ISSN={1077-3118}, url={http://dx.doi.org/10.1063/1.3249583}, DOI={10.1063/1.3249583}, number={15}, journal={Applied Physics Letters}, publisher={AIP Publishing}, author={Vailionis, Arturas and Boschker, Hans and Houwman, Evert and Koster, Gertjan and Rijnders, Guus and Blank, Dave H. A.}, year={2009}, month=oct }