Abstract
An isolated acceptor impurity is shown to be responsible for the ∼113-meV deep luminescence band which is frequently seen in GaAs layers grown by molecular-beam epitaxy. We establish that this center, which is also observed in melt-grown and solution-grown GaAs and which has often been associated with the presence of native defects, is due to Mn. The luminescence arises from donor-acceptor and conduction-band–acceptor recombination involving holes bound at the Mn acceptor. Electron paramagnetic resonance on Mn-doped layers shows that Mn is incorporated as an isolated defect with cubic symmetry. This result, coupled with the suppression of Mn-associated luminescence and electrical activation under Ga-rich growth conditions, indicates that Mn is incorporated primarily as a substitutional acceptor on Ga sites. Hole concentrations scale with Mn source temperature in a manner consistent with arrival-rate-controlled incorporation from a Knudsen effusion source. Room-temperature hole concentrations up to the 1018-cm−3 level can be achieved while maintaining excellent surface morphology. This suggests that Mn will be a useful dopant in the growth of junction structures by molecular-beam epitaxy.
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Dates
Type | When |
---|---|
Created | 22 years, 6 months ago (Feb. 14, 2003, 3:50 p.m.) |
Deposited | 1 year, 6 months ago (Feb. 4, 2024, 1:35 p.m.) |
Indexed | 1 year, 1 month ago (July 31, 2024, 9:10 a.m.) |
Issued | 50 years, 2 months ago (July 1, 1975) |
Published | 50 years, 2 months ago (July 1, 1975) |
Published Print | 50 years, 2 months ago (July 1, 1975) |
@article{Ilegems_1975, title={Optical and electrical properties of Mn-doped GaAs grown by molecular-beam epitaxy}, volume={46}, ISSN={1089-7550}, url={http://dx.doi.org/10.1063/1.321998}, DOI={10.1063/1.321998}, number={7}, journal={Journal of Applied Physics}, publisher={AIP Publishing}, author={Ilegems, M. and Dingle, R. and Rupp Jr., L. W.}, year={1975}, month=jul, pages={3059–3065} }