Abstract
The authors report on the fabrication of low-driven-voltage and high mobility ZnO thin-film transistor with sputtering Ta2O5 film as the dielectric. The device shows a field effect mobility of 60.4 cm2/V s, a threshold voltage of 1.1 V, an on/off ratio of 1.22×107, and a subthreshold swing of 0.23 V/decade. The high mobility partially resulted from the fringing-electric-field effect due to the undefined active layer. Therefore, considering our device geometry, the actual mobility is about 40.5 cm2/V s. We contribute the high performance to the proper dielectric thickness, smooth insulator surface, and relatively low trap state densities in the insulator/channel interface.
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Dates
Type | When |
---|---|
Created | 16 years ago (Aug. 25, 2009, 10:30 a.m.) |
Deposited | 2 years, 2 months ago (July 2, 2023, 8:02 p.m.) |
Indexed | 1 month ago (July 30, 2025, 6:53 a.m.) |
Issued | 16 years ago (Aug. 17, 2009) |
Published | 16 years ago (Aug. 17, 2009) |
Published Online | 16 years ago (Aug. 21, 2009) |
Published Print | 16 years ago (Aug. 17, 2009) |
@article{Zhang_2009, title={High performance ZnO-thin-film transistor with Ta2O5 dielectrics fabricated at room temperature}, volume={95}, ISSN={1077-3118}, url={http://dx.doi.org/10.1063/1.3206917}, DOI={10.1063/1.3206917}, number={7}, journal={Applied Physics Letters}, publisher={AIP Publishing}, author={Zhang, L. and Li, J. and Zhang, X. W. and Jiang, X. Y. and Zhang, Z. L.}, year={2009}, month=aug }