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AIP Publishing
Applied Physics Letters (317)
Abstract

To study the effect of stress concentration at the nanoscale, we performed fracture experiments on single edge notched thin film specimens inside the transmission electron microscope. Even at about 4 GPa stress at the notch tip, the specimens failed far away from the notch at places with no apparent stress concentration. The in situ electron microscopy showed evidence of little or no plastic deformation at the notch tip. We propose that the apparent notch insensitivity arises from the breakdown of the classical fracture mechanics at the nanoscale, where materials fail by reaching a uniform rupture stress and not due to stress concentration.

Bibliography

Kumar, S., Haque, M. A., & Gao, H. (2009). Notch insensitive fracture in nanoscale thin films. Applied Physics Letters, 94(25).

Authors 3
  1. S. Kumar (first)
  2. M. A. Haque (additional)
  3. H. Gao (additional)
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Dates
Type When
Created 16 years, 2 months ago (June 22, 2009, 6:26 p.m.)
Deposited 2 years, 2 months ago (June 23, 2023, 5:55 a.m.)
Indexed 3 weeks, 6 days ago (July 30, 2025, 6:53 a.m.)
Issued 16 years, 2 months ago (June 22, 2009)
Published 16 years, 2 months ago (June 22, 2009)
Published Online 16 years, 2 months ago (June 22, 2009)
Published Print 16 years, 2 months ago (June 22, 2009)
Funders 0

None

@article{Kumar_2009, title={Notch insensitive fracture in nanoscale thin films}, volume={94}, ISSN={1077-3118}, url={http://dx.doi.org/10.1063/1.3157276}, DOI={10.1063/1.3157276}, number={25}, journal={Applied Physics Letters}, publisher={AIP Publishing}, author={Kumar, S. and Haque, M. A. and Gao, H.}, year={2009}, month=jun }