DOI: 10.1063/1.3103603. Determination of energy band gap of nanocrystalline SbSI using diffuse reflectance spectroscopy

Determination of energy band gap of nanocrystalline SbSI using diffuse reflectance spectroscopy

10.1063/1.3103603

Crossref journal-article

AIP Publishing

Review of Scientific Instruments (317)

Abstract

Twelve methods of determining energy band gap (Eg) of semiconductors using diffuse reflectance spectroscopy have been applied in investigations of sonochemically produced antimony sulfoiodide (SbSI) consisting of nanowires. It has been proved that the best method of determining Eg is based on simultaneous fitting of many mechanisms of absorption to the spectral dependence of Kubelka–Munk function evaluated from the diffuse reflectance data. It allows determining the values of indirect forbidden Eg, the Urbach energy, and the constant absorption/scattering of the examined semiconductor.

Bibliography

Nowak, M., Kauch, B., & Szperlich, P. (2009). Determination of energy band gap of nanocrystalline SbSI using diffuse reflectance spectroscopy. Review of Scientific Instruments, 80(4).

Authors 3

M. Nowak (first)
B. Kauch (additional)
P. Szperlich (additional)

References 14 Referenced 292

{'volume-title': 'Optical Processes in Semiconductors', 'year': '1971', 'key': '2023063021213215500_c1'} / Optical Processes in Semiconductors (1971)
10.1117/1.1370387 / Opt. Eng. (2001)
10.1016/j.ultsonch.2007.09.003 / Ultrason. Sonochem. (2008)
10.1016/0927-0248(95)00021-6 / Sol. Energy Mater. Sol. Cells (1995)
See EPAPS Document No. E-RSINAK-80-007904 for the complete set of figures that present elaboration of the experimental data using different methods. For more information on EPAPS, see http://www.aip.org/pubservs/epaps.html.
10.1016/S0022-0248(03)01494-5 / J. Cryst. Growth (2003)
10.1016/S0925-8388(00)01452-3 / J. Alloys Compd. (2001)
10.1016/j.ssc.2004.07.055 / Solid State Commun. (2004)
10.1021/cm000390o / Chem. Mater. (2001)
10.1016/j.matlet.2004.10.043 / Mater. Lett. (2005)
{'key': '2023063021213215500_c11', 'first-page': '18', 'volume': 'S53', 'year': '2007', 'journal-title': 'Rev. Mex. Fis.'} / Rev. Mex. Fis. (2007)
10.1016/S0921-5093(03)00463-5 / Mater. Sci. Eng., A (2003)
10.1117/12.518846 / Proc. SPIE (2003)
{'volume-title': 'Ferroelectric Semiconductors', 'year': '1980', 'key': '2023063021213215500_c14'} / Ferroelectric Semiconductors (1980)

Dates

Type	When
Created	16 years, 4 months ago (April 22, 2009, 6:28 p.m.)
Deposited	2 years, 1 month ago (June 30, 2023, 5:21 p.m.)
Indexed	6 minutes ago (Aug. 30, 2025, 9:20 a.m.)
Issued	16 years, 4 months ago (April 1, 2009)
Published	16 years, 4 months ago (April 1, 2009)
Published Online	16 years, 4 months ago (April 21, 2009)
Published Print	16 years, 4 months ago (April 1, 2009)

Funders 0

None

BibTeX

@article{Nowak_2009, title={Determination of energy band gap of nanocrystalline SbSI using diffuse reflectance spectroscopy}, volume={80}, ISSN={1089-7623}, url={http://dx.doi.org/10.1063/1.3103603}, DOI={10.1063/1.3103603}, number={4}, journal={Review of Scientific Instruments}, publisher={AIP Publishing}, author={Nowak, M. and Kauch, B. and Szperlich, P.}, year={2009}, month=apr }

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