DOI: 10.1063/1.3070543. Switching spectroscopy piezoresponse force microscopy of polycrystalline capacitor structures

Switching spectroscopy piezoresponse force microscopy of polycrystalline capacitor structures

10.1063/1.3070543

Crossref journal-article

AIP Publishing

Applied Physics Letters (317)

Abstract

Polarization switching in polycrystalline PbZr0.52Ti0.48O3 films on Pt-coated Si substrates was studied by switching spectroscopy piezoresponse force microscopy (SSPFM). Acquisition of multiple hysteresis loops allows polarization switching parameters, including nucleation, coercive biases, and switchable response to be mapped in real space. In contrast to measurements made on the free surface, those on the metal-ferroelectric-metal capacitor structures show the evolution of correlated switching of 102–103 grain clusters with well-defined imprint and nucleation biases. The role of substrate bending on clustering and SSPFM detection mechanisms are discussed. These studies demonstrate real-space imaging of mesoscopic polarization reversal in real-world devices.

Bibliography

Bintachitt, P., Trolier-McKinstry, S., Seal, K., Jesse, S., & Kalinin, S. V. (2009). Switching spectroscopy piezoresponse force microscopy of polycrystalline capacitor structures. Applied Physics Letters, 94(4).

Authors 5

Patamas Bintachitt (first)
Susan Trolier-McKinstry (additional)
Katyayani Seal (additional)
Stephen Jesse (additional)
Sergei V. Kalinin (additional)

References 21 Referenced 57

{'volume-title': 'Ferroelectric Memories', 'year': '2000', 'key': '2023070222073078700_c1'} / Ferroelectric Memories (2000)
{'volume-title': 'Nanoelectronics and Information Technology', 'year': '2003', 'author': 'Waser', 'key': '2023070222073078700_c2'} / Nanoelectronics and Information Technology by Waser (2003)
10.1023/B:JECR.0000033998.72845.51 / J. Electroceram. (2004)
10.1111/j.1551-2916.2006.01137.x / J. Am. Ceram. Soc. (2006)
10.1063/1.122914 / Appl. Phys. Lett. (1998)
10.1088/0034-4885/69/8/R04 / Rep. Prog. Phys. (2006)
10.1063/1.1850652 / Rev. Sci. Instrum. (2005)
10.1063/1.2790485 / Appl. Phys. Lett. (2007)
10.1063/1.1845573 / Appl. Phys. Lett. (2005)
{'volume-title': 'Piezoelectric Ceramics', 'year': '1971', 'key': '2023070222073078700_c10'} / Piezoelectric Ceramics (1971)
10.1016/0022-3697(96)00019-4 / J. Phys. Chem. Solids (1996)
10.1063/1.2905266 / Appl. Phys. Lett. (2008)
10.1063/1.2214699 / Rev. Sci. Instrum. (2006)
10.1063/1.2172216 / Appl. Phys. Lett. (2006)
10.1063/1.1494122 / Appl. Phys. Lett. (2002)
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10.1063/1.1140644 / Rev. Sci. Instrum. (1989)
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Dates

Type	When
Created	16 years, 6 months ago (Jan. 30, 2009, 11:20 p.m.)
Deposited	1 year, 5 months ago (March 9, 2024, 4:25 p.m.)
Indexed	3 weeks, 5 days ago (July 30, 2025, 6:51 a.m.)
Issued	16 years, 6 months ago (Jan. 26, 2009)
Published	16 years, 6 months ago (Jan. 26, 2009)
Published Online	16 years, 6 months ago (Jan. 29, 2009)
Published Print	16 years, 6 months ago (Jan. 26, 2009)

Funders 0

None

BibTeX

@article{Bintachitt_2009, title={Switching spectroscopy piezoresponse force microscopy of polycrystalline capacitor structures}, volume={94}, ISSN={1077-3118}, url={http://dx.doi.org/10.1063/1.3070543}, DOI={10.1063/1.3070543}, number={4}, journal={Applied Physics Letters}, publisher={AIP Publishing}, author={Bintachitt, Patamas and Trolier-McKinstry, Susan and Seal, Katyayani and Jesse, Stephen and Kalinin, Sergei V.}, year={2009}, month=jan }

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