DOI: 10.1063/1.3021472. PolLux: A new facility for soft x-ray spectromicroscopy at the Swiss Light Source

PolLux: A new facility for soft x-ray spectromicroscopy at the Swiss Light Source

10.1063/1.3021472

Crossref journal-article

AIP Publishing

Review of Scientific Instruments (317)

Abstract

We report on the successful installation and operation of a scanning transmission x-ray microspectroscope (STXM) at the PolLux facility at the Swiss Light Source. This integration of an advanced STXM with improved sample handling capabilities and a novel beamline provides unique capabilities. PolLux uses linearly or circularly polarized x-rays from a bending magnet with an extended photon energy range (200–1400 eV). It is therefore well suited to determine a sample’s quantitative chemical composition, molecular orientation, or thickness of organic as well as condensed matter materials. The local magnetic state of magnetic thin films is accessible through fast helicity switching by steering the electron beam off axis through the bending magnet. Ex vacuo girder movers allow fast and highly reproducible (&lt;1 μm) alignment of the instrument with respect to the photon beam. The present spatial resolution is ∼20 nm, limited by the zone plates utilized. The instrument has the stability and positional resolution to operate with much higher resolution optics as it becomes available. In addition to characterization experiments, we present several typical examples from materials research and environmental science to exemplify the capabilities.

Bibliography

Raabe, J., Tzvetkov, G., Flechsig, U., BÃ¶ge, M., Jaggi, A., Sarafimov, B., Vernooij, M. G. C., Huthwelker, T., Ade, H., Kilcoyne, D., Tyliszczak, T., Fink, R. H., & Quitmann, C. (2008). PolLux: A new facility for soft x-ray spectromicroscopy at the Swiss Light Source. Review of Scientific Instruments, 79(11).

Authors 13

J. Raabe (first)
G. Tzvetkov (additional)
U. Flechsig (additional)
M. Böge (additional)
A. Jaggi (additional)
B. Sarafimov (additional)
M. G. C. Vernooij (additional)
T. Huthwelker (additional)
H. Ade (additional)
D. Kilcoyne (additional)
T. Tyliszczak (additional)
R. H. Fink (additional)
C. Quitmann (additional)

References 55 Referenced 228

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Dates

Type	When
Created	16 years, 9 months ago (Nov. 13, 2008, 6:06 p.m.)
Deposited	2 years, 1 month ago (July 3, 2023, 7:37 p.m.)
Indexed	5 days, 1 hour ago (Aug. 29, 2025, 5:52 a.m.)
Issued	16 years, 10 months ago (Nov. 1, 2008)
Published	16 years, 10 months ago (Nov. 1, 2008)
Published Online	16 years, 9 months ago (Nov. 13, 2008)
Published Print	16 years, 10 months ago (Nov. 1, 2008)

Funders 0

None

BibTeX

@article{Raabe_2008, title={PolLux: A new facility for soft x-ray spectromicroscopy at the Swiss Light Source}, volume={79}, ISSN={1089-7623}, url={http://dx.doi.org/10.1063/1.3021472}, DOI={10.1063/1.3021472}, number={11}, journal={Review of Scientific Instruments}, publisher={AIP Publishing}, author={Raabe, J. and Tzvetkov, G. and Flechsig, U. and Böge, M. and Jaggi, A. and Sarafimov, B. and Vernooij, M. G. C. and Huthwelker, T. and Ade, H. and Kilcoyne, D. and Tyliszczak, T. and Fink, R. H. and Quitmann, C.}, year={2008}, month=nov }

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