Abstract
A series of MgxZn1−xO thin films has been prepared by metalorganic chemical vapor deposition and metal-semiconductor-metal structured ultraviolet photodetectors are fabricated from these films. The cutoff wavelengths of the photodetectors can cover the whole solar-blind spectrum range (220–280 nm) by varying Mg content in the MgxZn1−xO thin films. As a representative, the photodetector fabricated from Mg0.52Zn0.48O shows an ultraviolet/visible rejection ratio of about four orders of magnitude, and the dark current is 15 pA at 10 V bias. These results demonstrate that high-performance photodetectors operating in the whole solar-blind spectrum range can be realized in MgxZn1−xO films.
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Dates
Type | When |
---|---|
Created | 16 years, 10 months ago (Oct. 29, 2008, 6:18 p.m.) |
Deposited | 2 years, 2 months ago (June 27, 2023, 3:20 p.m.) |
Indexed | 1 week, 1 day ago (Aug. 23, 2025, 9:47 p.m.) |
Issued | 16 years, 10 months ago (Oct. 27, 2008) |
Published | 16 years, 10 months ago (Oct. 27, 2008) |
Published Online | 16 years, 10 months ago (Oct. 29, 2008) |
Published Print | 16 years, 10 months ago (Oct. 27, 2008) |
@article{Ju_2008, title={Mg x Zn 1 − x O -based photodetectors covering the whole solar-blind spectrum range}, volume={93}, ISSN={1077-3118}, url={http://dx.doi.org/10.1063/1.3002371}, DOI={10.1063/1.3002371}, number={17}, journal={Applied Physics Letters}, publisher={AIP Publishing}, author={Ju, Z. G. and Shan, C. X. and Jiang, D. Y. and Zhang, J. Y. and Yao, B. and Zhao, D. X. and Shen, D. Z. and Fan, X. W.}, year={2008}, month=oct }