DOI: 10.1063/1.2938846. Characteristic capacitance in an electric force microscope determined by using sample surface bias effect

Characteristic capacitance in an electric force microscope determined by using sample surface bias effect

10.1063/1.2938846

Crossref journal-article

AIP Publishing

Journal of Applied Physics (317)

Abstract

A method to determine the dependence of characteristic capacitance of an electric force microscopy tip on tip-sample separation is presented. It is demonstrated that by introducing sufficient voltage to the sample surface, the first derivative of the characteristic capacitance for tip-sample complex could be obtained and, subsequently, the characteristic capacitance versus tip-sample separation could be determined. In addition, the effective charge position on the tip relative to sample surface could also be identified.

Bibliography

Qi, G. C., Yan, H., Guan, L., Yang, Y. L., Qiu, X. H., Wang, C., Li, Y. B., & Jiang, Y. P. (2008). Characteristic capacitance in an electric force microscope determined by using sample surface bias effect. Journal of Applied Physics, 103(11).

Authors 8

G. C. Qi (first)
H. Yan (additional)
L. Guan (additional)
Y. L. Yang (additional)
X. H. Qiu (additional)
C. Wang (additional)
Y. B. Li (additional)
Y. P. Jiang (additional)

References 16 Referenced 9

10.1063/1.1844615 / J. Appl. Phys. (2005)
10.1103/PhysRevLett.63.2669 / Phys. Rev. Lett. (1989)
10.1103/PhysRevLett.83.4840 / Phys. Rev. Lett. (1999)
10.1021/jp0265438 / J. Phys. Chem. B (2003)
10.1103/PhysRevB.69.035321 / Phys. Rev. B (2004)
10.1103/PhysRevLett.92.216803 / Phys. Rev. Lett. (2004)
10.1063/1.363884 / J. Appl. Phys. (1997)
10.1063/1.1884764 / Appl. Phys. Lett. (2005)
10.1002/macp.200600136 / Macromol. Chem. Phys. (2006)
10.1063/1.99224 / Appl. Phys. Lett. (1988)
10.1063/1.347347 / J. Appl. Phys. (1991)
{'key': '2023070503165236100_c12'}
10.1063/1.1506188 / J. Appl. Phys. (2002)
10.1021/jp001659u / J. Phys. Chem. B (2000)
10.1103/PhysRevB.72.165420 / Phys. Rev. B (2005)
10.1063/1.1898183 / Rev. Sci. Instrum. (2005)

Dates

Type	When
Created	17 years, 2 months ago (June 11, 2008, 6:12 p.m.)
Deposited	2 years, 1 month ago (July 5, 2023, 2:01 p.m.)
Indexed	4 weeks, 2 days ago (July 30, 2025, 6:50 a.m.)
Issued	17 years, 2 months ago (June 1, 2008)
Published	17 years, 2 months ago (June 1, 2008)
Published Online	17 years, 2 months ago (June 11, 2008)
Published Print	17 years, 2 months ago (June 1, 2008)

Funders 0

None

BibTeX

@article{Qi_2008, title={Characteristic capacitance in an electric force microscope determined by using sample surface bias effect}, volume={103}, ISSN={1089-7550}, url={http://dx.doi.org/10.1063/1.2938846}, DOI={10.1063/1.2938846}, number={11}, journal={Journal of Applied Physics}, publisher={AIP Publishing}, author={Qi, G. C. and Yan, H. and Guan, L. and Yang, Y. L. and Qiu, X. H. and Wang, C. and Li, Y. B. and Jiang, Y. P.}, year={2008}, month=jun }

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