Abstract
We present a facile route which combines the functionalization of a highly oriented pyrolytic graphite surface with an atomic layer deposition (ALD) process to allow for conformal Al2O3 layers. While the trimethylaluminum (TMA)∕H2O process caused selective deposition only along step edges, the TMA∕O3 process began to provide nucleation sites on the basal planes of the surface. O3 pretreatment, immediately followed by the ALD process with TMA∕O3 chemistry, formed Al2O3 layers without any preferential deposition at the step edges. This is attributed to functionalization of graphene by ozone treatment, imparting a hydrophilic character which is desirable for ALD deposition.
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Dates
Type | When |
---|---|
Created | 17 years, 3 months ago (May 21, 2008, 12:11 p.m.) |
Deposited | 2 years, 2 months ago (June 22, 2023, 9:43 p.m.) |
Indexed | 3 days, 18 hours ago (Aug. 20, 2025, 8:53 a.m.) |
Issued | 17 years, 3 months ago (May 19, 2008) |
Published | 17 years, 3 months ago (May 19, 2008) |
Published Online | 17 years, 3 months ago (May 20, 2008) |
Published Print | 17 years, 3 months ago (May 19, 2008) |
@article{Lee_2008, title={Conformal Al2O3 dielectric layer deposited by atomic layer deposition for graphene-based nanoelectronics}, volume={92}, ISSN={1077-3118}, url={http://dx.doi.org/10.1063/1.2928228}, DOI={10.1063/1.2928228}, number={20}, journal={Applied Physics Letters}, publisher={AIP Publishing}, author={Lee, Bongki and Park, Seong-Yong and Kim, Hyun-Chul and Cho, KyeongJae and Vogel, Eric M. and Kim, Moon J. and Wallace, Robert M. and Kim, Jiyoung}, year={2008}, month=may }