DOI: 10.1063/1.2841802. In situ 3ω techniques for measuring thermal conductivity of phase-change materials

In situ 3ω techniques for measuring thermal conductivity of phase-change materials

10.1063/1.2841802

Crossref journal-article

AIP Publishing

Review of Scientific Instruments (317)

Abstract

Knowledge of the thermal conductivity of phase-change materials is essential for accurate modeling of nonvolatile memory devices that incorporate them. The “3ω method” is a well-established and sensitive technique for measuring this property. We report two new extensions of the 3ω technique that feature in situ monitoring of the phase-change material as it transitions from the as-deposited amorphous phase to the crystalline phase. One technique crystallizes the entire sample in a vacuum oven, while using the 3ω voltage to monitor the phase transition. The other technique uses the 3ω heater to crystallize only the material in the region of measurement.

Bibliography

Risk, W. P., Rettner, C. T., & Raoux, S. (2008). In situ 3Ï techniques for measuring thermal conductivity of phase-change materials. Review of Scientific Instruments, 79(2).

Authors 3

W. P. Risk (first)
C. T. Rettner (additional)
S. Raoux (additional)

References 14 Referenced 16

{'volume': '2006', 'journal-title': 'Tech. Dig. - Int. Electron Devices Meet.', 'first-page': '1', 'key': '2023070600231699600_c1'} / Tech. Dig. - Int. Electron Devices Meet.
10.1109/LED.2007.901347 / IEEE Electron Device Lett. (2007)
10.1063/1.1141498 / Rev. Sci. Instrum. (1990)
10.1063/1.1505652 / Rev. Sci. Instrum. (2002)
10.1063/1.1524305 / J. Appl. Phys. (2003)
10.1063/1.1819431 / Rev. Sci. Instrum. (2004)
10.1063/1.1896619 / Rev. Sci. Instrum. (2005)
10.1103/PhysRevB.50.6077 / Phys. Rev. B (1994)
10.1063/1.373041 / J. Appl. Phys. (2000)
10.1063/1.126852 / Appl. Phys. Lett. (2000)
10.1063/1.1944910 / J. Appl. Phys. (2005)
10.1063/1.2784169 / Appl. Phys. Lett. (2007)
10.1063/1.2359354 / Appl. Phys. Lett. (2006)
10.1063/1.1481958 / J. Appl. Phys. (2002)

Dates

Type	When
Created	17 years, 6 months ago (Feb. 15, 2008, 6:40 p.m.)
Deposited	2 years, 1 month ago (July 5, 2023, 10:24 p.m.)
Indexed	3 weeks ago (July 30, 2025, 6:50 a.m.)
Issued	17 years, 6 months ago (Feb. 1, 2008)
Published	17 years, 6 months ago (Feb. 1, 2008)
Published Online	17 years, 6 months ago (Feb. 15, 2008)
Published Print	17 years, 6 months ago (Feb. 1, 2008)

Funders 0

None

BibTeX

@article{Risk_2008, title={In situ 3ω techniques for measuring thermal conductivity of phase-change materials}, volume={79}, ISSN={1089-7623}, url={http://dx.doi.org/10.1063/1.2841802}, DOI={10.1063/1.2841802}, number={2}, journal={Review of Scientific Instruments}, publisher={AIP Publishing}, author={Risk, W. P. and Rettner, C. T. and Raoux, S.}, year={2008}, month=feb }

JSON

{
  "indexed": {
    "date-parts": [
      [
        2025,
        7,
        30
      ]
    ],
    "date-time": "2025-07-30T10:50:26Z",
    "timestamp": 1753872626042,
    "version": "3.41.2"
  },
  "reference-count": 14,
  "publisher": "AIP Publishing",
  "issue": "2",
  "content-domain": {
    "domain": [
      "pubs.aip.org"
    ],
    "crossmark-restriction": true
  },
  "published-print": {
    "date-parts": [
      [
        2008,
        2,
        1
      ]
    ]
  },
  "abstract": "<jats:p>Knowledge of the thermal conductivity of phase-change materials is essential for accurate modeling of nonvolatile memory devices that incorporate them. The \u201c3\u03c9 method\u201d is a well-established and sensitive technique for measuring this property. We report two new extensions of the 3\u03c9 technique that feature in situ monitoring of the phase-change material as it transitions from the as-deposited amorphous phase to the crystalline phase. One technique crystallizes the entire sample in a vacuum oven, while using the 3\u03c9 voltage to monitor the phase transition. The other technique uses the 3\u03c9 heater to crystallize only the material in the region of measurement.</jats:p>",
  "DOI": "10.1063/1.2841802",
  "type": "journal-article",
  "created": {
    "date-parts": [
      [
        2008,
        2,
        15
      ]
    ],
    "date-time": "2008-02-15T23:40:07Z",
    "timestamp": 1203118807000
  },
  "update-policy": "https://doi.org/10.1063/aip-crossmark-policy-page",
  "source": "Crossref",
  "is-referenced-by-count": 16,
  "title": "In situ 3\u03c9 techniques for measuring thermal conductivity of phase-change materials",
  "prefix": "10.1063",
  "volume": "79",
  "author": [
    {
      "given": "W. P.",
      "family": "Risk",
      "sequence": "first",
      "affiliation": [
        {
          "name": "IBM Almaden Research Center IBM/Qimonda/Macronix PCRAM Joint Project, , 650 Harry Rd., San Jose, California 95120, USA"
        }
      ]
    },
    {
      "given": "C. T.",
      "family": "Rettner",
      "sequence": "additional",
      "affiliation": [
        {
          "name": "IBM Almaden Research Center IBM/Qimonda/Macronix PCRAM Joint Project, , 650 Harry Rd., San Jose, California 95120, USA"
        }
      ]
    },
    {
      "given": "S.",
      "family": "Raoux",
      "sequence": "additional",
      "affiliation": [
        {
          "name": "IBM Almaden Research Center IBM/Qimonda/Macronix PCRAM Joint Project, , 650 Harry Rd., San Jose, California 95120, USA"
        }
      ]
    }
  ],
  "member": "317",
  "published-online": {
    "date-parts": [
      [
        2008,
        2,
        15
      ]
    ]
  },
  "reference": [
    {
      "volume": "2006",
      "journal-title": "Tech. Dig. - Int. Electron Devices Meet.",
      "first-page": "1",
      "key": "2023070600231699600_c1"
    },
    {
      "key": "2023070600231699600_c2",
      "doi-asserted-by": "publisher",
      "first-page": "697",
      "DOI": "10.1109/LED.2007.901347",
      "volume": "28",
      "year": "2007",
      "journal-title": "IEEE Electron Device Lett."
    },
    {
      "key": "2023070600231699600_c3a",
      "doi-asserted-by": "publisher",
      "first-page": "802",
      "DOI": "10.1063/1.1141498",
      "volume": "61",
      "year": "1990",
      "journal-title": "Rev. Sci. Instrum."
    },
    {
      "key": "2023070600231699600_c3b",
      "doi-asserted-by": "publisher",
      "first-page": "3701",
      "DOI": "10.1063/1.1505652",
      "volume": "73",
      "year": "2002",
      "journal-title": "Rev. Sci. Instrum."
    },
    {
      "key": "2023070600231699600_c4",
      "doi-asserted-by": "publisher",
      "first-page": "793",
      "DOI": "10.1063/1.1524305",
      "volume": "93",
      "year": "2003",
      "journal-title": "J. Appl. Phys."
    },
    {
      "key": "2023070600231699600_c5",
      "doi-asserted-by": "publisher",
      "first-page": "5119",
      "DOI": "10.1063/1.1819431",
      "volume": "75",
      "year": "2004",
      "journal-title": "Rev. Sci. Instrum."
    },
    {
      "key": "2023070600231699600_c6",
      "doi-asserted-by": "publisher",
      "first-page": "053901",
      "DOI": "10.1063/1.1896619",
      "volume": "76",
      "year": "2005",
      "journal-title": "Rev. Sci. Instrum."
    },
    {
      "key": "2023070600231699600_c7",
      "doi-asserted-by": "publisher",
      "first-page": "6077",
      "DOI": "10.1103/PhysRevB.50.6077",
      "volume": "50",
      "year": "1994",
      "journal-title": "Phys. Rev. B"
    },
    {
      "key": "2023070600231699600_c8",
      "doi-asserted-by": "publisher",
      "first-page": "4130",
      "DOI": "10.1063/1.373041",
      "volume": "87",
      "year": "2000",
      "journal-title": "J. Appl. Phys."
    },
    {
      "key": "2023070600231699600_c9",
      "doi-asserted-by": "publisher",
      "first-page": "3864",
      "DOI": "10.1063/1.126852",
      "volume": "76",
      "year": "2000",
      "journal-title": "Appl. Phys. Lett."
    },
    {
      "key": "2023070600231699600_c10",
      "doi-asserted-by": "publisher",
      "first-page": "013520",
      "DOI": "10.1063/1.1944910",
      "volume": "98",
      "year": "2005",
      "journal-title": "J. Appl. Phys."
    },
    {
      "key": "2023070600231699600_c11",
      "doi-asserted-by": "publisher",
      "first-page": "111904",
      "DOI": "10.1063/1.2784169",
      "volume": "91",
      "year": "2007",
      "journal-title": "Appl. Phys. Lett."
    },
    {
      "key": "2023070600231699600_c12",
      "doi-asserted-by": "publisher",
      "first-page": "151904",
      "DOI": "10.1063/1.2359354",
      "volume": "89",
      "year": "2006",
      "journal-title": "Appl. Phys. Lett."
    },
    {
      "key": "2023070600231699600_c13",
      "doi-asserted-by": "publisher",
      "first-page": "9772",
      "DOI": "10.1063/1.1481958",
      "volume": "91",
      "year": "2002",
      "journal-title": "J. Appl. Phys."
    }
  ],
  "container-title": "Review of Scientific Instruments",
  "original-title": [],
  "language": "en",
  "link": [
    {
      "URL": "https://pubs.aip.org/aip/rsi/article-pdf/doi/10.1063/1.2841802/14115462/026108_1_online.pdf",
      "content-type": "application/pdf",
      "content-version": "vor",
      "intended-application": "syndication"
    },
    {
      "URL": "https://pubs.aip.org/aip/rsi/article-pdf/doi/10.1063/1.2841802/14115462/026108_1_online.pdf",
      "content-type": "unspecified",
      "content-version": "vor",
      "intended-application": "similarity-checking"
    }
  ],
  "deposited": {
    "date-parts": [
      [
        2023,
        7,
        6
      ]
    ],
    "date-time": "2023-07-06T02:24:36Z",
    "timestamp": 1688610276000
  },
  "score": 1,
  "resource": {
    "primary": {
      "URL": "https://pubs.aip.org/rsi/article/79/2/026108/387629/In-situ-3-techniques-for-measuring-thermal"
    }
  },
  "subtitle": [],
  "short-title": [],
  "issued": {
    "date-parts": [
      [
        2008,
        2,
        1
      ]
    ]
  },
  "references-count": 14,
  "journal-issue": {
    "issue": "2",
    "published-print": {
      "date-parts": [
        [
          2008,
          2,
          1
        ]
      ]
    }
  },
  "URL": "http://dx.doi.org/10.1063/1.2841802",
  "relation": {},
  "ISSN": [
    "0034-6748",
    "1089-7623"
  ],
  "subject": [],
  "published-other": {
    "date-parts": [
      [
        2008,
        2
      ]
    ]
  },
  "published": {
    "date-parts": [
      [
        2008,
        2,
        1
      ]
    ]
  },
  "article-number": "026108"
}