Abstract
Micro-Raman spectroscopy has been used to study lattice dynamics associated with the ferroelectric domains of a BiFeO3 single crystal at low temperature. The phonon assignment shows a large frequency splitting between the transverse and longitudinal components of the A1 phonon mode related to the Bi–O bonds in contrast with thin films where the splitting is negligible. Applying an external electric field induces frequency shifts of the low energy modes related to the Bi–O bonds. These softenings are due to a tensile stress via the piezoelectric effect. The authors give estimates of the phonon deformation potentials.
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Dates
Type | When |
---|---|
Created | 18 years ago (Aug. 15, 2007, 10:22 a.m.) |
Deposited | 2 years, 2 months ago (June 22, 2023, 9:59 p.m.) |
Indexed | 3 weeks, 4 days ago (July 30, 2025, 6:50 a.m.) |
Issued | 18 years ago (Aug. 13, 2007) |
Published | 18 years ago (Aug. 13, 2007) |
Published Online | 18 years ago (Aug. 14, 2007) |
Published Print | 18 years ago (Aug. 13, 2007) |
@article{Cazayous_2007, title={Electric field effect on BiFeO3 single crystal investigated by Raman spectroscopy}, volume={91}, ISSN={1077-3118}, url={http://dx.doi.org/10.1063/1.2771380}, DOI={10.1063/1.2771380}, number={7}, journal={Applied Physics Letters}, publisher={AIP Publishing}, author={Cazayous, M. and Malka, D. and Lebeugle, D. and Colson, D.}, year={2007}, month=aug }