DOI: 10.1063/1.2767149. <i>In situ</i> imaging of electromigration-induced nanogap formation by transmission electron microscopy

In situ imaging of electromigration-induced nanogap formation by transmission electron microscopy

10.1063/1.2767149

Crossref journal-article

AIP Publishing

Applied Physics Letters (317)

Abstract

The authors imaged electromigration-induced nanogap formation in situ by transmission electron microscopy. Real-time video recordings show that edge voids form near the cathode side. The polycrystalline gold wires narrow down until a single-grain boundary intersects the constriction along which the breaking continues. During the last 50ms of the break, a relatively large deformation of the constriction’s geometry occurs. The shape of the anode (blunt) and the cathode (sharp) is asymmetric when the wire breaks with a bias voltage applied, but symmetric when a narrow constriction breaks spontaneously.

Bibliography

Heersche, H. B., Lientschnig, G., OâNeill, K., van der Zant, H. S. J., & Zandbergen, H. W. (2007). In situ imaging of electromigration-induced nanogap formation by transmission electron microscopy. Applied Physics Letters, 91(7).

Authors 5

Hubert B. Heersche (first)
Günther Lientschnig (additional)
Kevin O’Neill (additional)
Herre S. J. van der Zant (additional)
Henny W. Zandbergen (additional)

References 14 Referenced 80

10.1063/1.124354 / Appl. Phys. Lett. (1999)
10.1038/35024031 / Nature (London) (2000)
10.1038/nature00791 / Nature (London) (2002)
10.1038/nature00790 / Nature (London) (2002)
10.1103/PhysRevLett.93.266802 / Phys. Rev. Lett. (2004)
10.1063/1.2149174 / Appl. Phys. Lett. (2005)
10.1063/1.1857095 / Appl. Phys. Lett. (2005)
10.1021/nl050799i / Nano Lett. (2005)
10.1088/0957-4484/14/7/313 / Nanotechnology (2003)
10.1021/nl052302a / Nano Lett. (2006)
10.1021/nl062631i / Nano Lett. (2007)
See EPAPS Document No. E-APPLAB-91-004731 for video recordings. This document can be reached via a direct link in the online article’s HTML reference section or via the EPAPS homepage (http://www.aip.org/pubservs/epaps. html).
10.1063/1.108284 / Appl. Phys. Lett. (1992)
10.1063/1.370656 / J. Appl. Phys. (1999)

Dates

Type	When
Created	18 years ago (Aug. 18, 2007, 6:14 p.m.)
Deposited	2 years, 2 months ago (June 22, 2023, 9:58 p.m.)
Indexed	3 weeks, 4 days ago (July 30, 2025, 6:49 a.m.)
Issued	18 years ago (Aug. 13, 2007)
Published	18 years ago (Aug. 13, 2007)
Published Online	18 years ago (Aug. 17, 2007)
Published Print	18 years ago (Aug. 13, 2007)

Funders 0

None

BibTeX

@article{Heersche_2007, title={In situ imaging of electromigration-induced nanogap formation by transmission electron microscopy}, volume={91}, ISSN={1077-3118}, url={http://dx.doi.org/10.1063/1.2767149}, DOI={10.1063/1.2767149}, number={7}, journal={Applied Physics Letters}, publisher={AIP Publishing}, author={Heersche, Hubert B. and Lientschnig, Günther and O’Neill, Kevin and van der Zant, Herre S. J. and Zandbergen, Henny W.}, year={2007}, month=aug }

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