Abstract
We use the locally generated photovoltage in carbon nanotubes to image potential modulations produced by defects. The correlation with spatially resolved spectroscopy of the disorder-enhanced Raman band allows us to locate the defects and to determine their effect on band bending. The defects produce local potential maxima, which are consistent with trapped electrons near the tube. An offset photovoltage is generated when the laser populates metastable traps in the oxide. Previously uncharged defects can thus be imaged. To demonstrate the versatility of the technique, we show that tube-tube junction at the base of nanotube loops can be electronically characterized.
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Dates
Type | When |
---|---|
Created | 18 years, 1 month ago (July 16, 2007, 8:42 p.m.) |
Deposited | 2 years, 2 months ago (June 23, 2023, 8:09 p.m.) |
Indexed | 1 month ago (July 30, 2025, 6:49 a.m.) |
Issued | 18 years, 1 month ago (July 16, 2007) |
Published | 18 years, 1 month ago (July 16, 2007) |
Published Online | 18 years, 1 month ago (July 16, 2007) |
Published Print | 18 years, 1 month ago (July 16, 2007) |
@article{Freitag_2007, title={Scanning photovoltage microscopy of potential modulations in carbon nanotubes}, volume={91}, ISSN={1077-3118}, url={http://dx.doi.org/10.1063/1.2757100}, DOI={10.1063/1.2757100}, number={3}, journal={Applied Physics Letters}, publisher={AIP Publishing}, author={Freitag, Marcus and Tsang, James C. and Bol, Ageeth and Avouris, Phaedon and Yuan, Dongning and Liu, Jie}, year={2007}, month=jul }