DOI: 10.1063/1.2743166. Calibrating a tuning fork for use as a scanning probe microscope force sensor

Calibrating a tuning fork for use as a scanning probe microscope force sensor

10.1063/1.2743166

Crossref journal-article

AIP Publishing

Review of Scientific Instruments (317)

Abstract

Quartz tuning forks mounted with sharp tips provide an alternate method to silicon microcantilevers for probing the tip-substrate interaction in scanning probe microscopy. The high quality factor and stable resonant frequency of the tuning fork allow accurate measurements of small shifts in the resonant frequency as the tip approaches the substrate. To permit an accurate measure of surface interaction forces, the electrical and piezoelectromechanical properties of a tuning fork have been characterized using a fiber optical interferometer.

Bibliography

Qin, Y., & Reifenberger, R. (2007). Calibrating a tuning fork for use as a scanning probe microscope force sensor. Review of Scientific Instruments, 78(6).

Authors 2

Yexian Qin (first)
R. Reifenberger (additional)

References 15 Referenced 63

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10.1063/1.365936 / J. Appl. Phys. (1997)
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10.1103/RevModPhys.75.949 / Rev. Mod. Phys. (2003)
10.1088/0957-4484/15/2/017 / Nanotechnology (2004)
{'key': '2023070817212360300_c8'}
10.1063/1.1150521 / Rev. Sci. Instrum. (2000)
{'year': '2003', 'key': '2023070817212360300_c10'} (2003)
10.1166/jnn.2006.17960 / J. Nanosci. Nanotechnol. (2006)
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Dates

Type	When
Created	18 years, 2 months ago (June 14, 2007, 1:13 a.m.)
Deposited	2 years, 1 month ago (July 8, 2023, 1:21 p.m.)
Indexed	3 weeks, 6 days ago (July 30, 2025, 6:49 a.m.)
Issued	18 years, 2 months ago (June 1, 2007)
Published	18 years, 2 months ago (June 1, 2007)
Published Online	18 years, 2 months ago (June 13, 2007)
Published Print	18 years, 2 months ago (June 1, 2007)

Funders 0

None

BibTeX

@article{Qin_2007, title={Calibrating a tuning fork for use as a scanning probe microscope force sensor}, volume={78}, ISSN={1089-7623}, url={http://dx.doi.org/10.1063/1.2743166}, DOI={10.1063/1.2743166}, number={6}, journal={Review of Scientific Instruments}, publisher={AIP Publishing}, author={Qin, Yexian and Reifenberger, R.}, year={2007}, month=jun }

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