Abstract
The Schottky barrier height in metal/Ge contacts shows weak dependence on the metal work function indicating strong Fermi-level pinning close to the Bardeen limit. The pinning factor S is about 0.05 and the charge neutrality level (CNL) is only about 0.09eV above the top of the valence band. Because of this, the Fermi level in Ge lies higher than CNL in most cases of interest so that unpassivated acceptorlike gap states at the interface are easily filled, building up a net negative fixed charge. This could prevent efficient inversion of a p-type Ge surface in a metal-oxide-semiconductor structure.
References
29
Referenced
556
10.1016/S0927-796X(01)00037-7
/ Mater. Sci. Eng., R. (2001){'volume': '2002', 'journal-title': 'Tech. Dig. - Int. Electron Devices Meet.', 'first-page': '437', 'key': '2023080105151513000_c2'}
/ Tech. Dig. - Int. Electron Devices Meet.{'volume': '2002', 'journal-title': 'Tech. Dig. - Int. Electron Devices Meet.', 'first-page': '441', 'key': '2023080105151513000_c3'}
/ Tech. Dig. - Int. Electron Devices Meet.{'volume': '2005', 'journal-title': 'Tech. Dig. - Int. Electron Devices Meet.', 'first-page': '17', 'key': '2023080105151513000_c4'}
/ Tech. Dig. - Int. Electron Devices Meet.10.1063/1.2189456
/ Appl. Phys. Lett. (2006){'key': '2023080105151513000_c6', 'first-page': '32'}
{'volume': '2004', 'journal-title': 'Tech. Dig. - Int. Electron Devices Meet.', 'first-page': '307', 'key': '2023080105151513000_c7'}
/ Tech. Dig. - Int. Electron Devices Meet.{'volume': '2003', 'journal-title': 'Tech. Dig. - Int. Electron Devices Meet.', 'first-page': '437', 'key': '2023080105151513000_c8'}
/ Tech. Dig. - Int. Electron Devices Meet.10.1109/LED.2003.823060
/ IEEE Electron Device Lett. (2004){'key': '2023080105151513000_c10', 'first-page': '142'}
10.1109/LED.2006.870242
/ IEEE Electron Device Lett. (2006)10.1063/1.2037861
/ Appl. Phys. Lett. (2005)10.1109/LED.2004.841442
/ IEEE Electron Device Lett. (2005)10.1016/j.tsf.2005.09.033
/ Thin Solid Films (2006)10.1063/1.1923162
/ J. Appl. Phys. (2005)10.1016/0038-1101(73)90052-X
/ Solid-State Electron. (1973)10.1557/PROC-47-161
/ Mater. Res. Soc. Symp. Proc. (1985)10.1103/PhysRevB.30.4874
/ Phys. Rev. B (1984)10.1103/PhysRevB.35.6182
/ Phys. Rev. B (1987)10.1007/BF00615935
/ Appl. Phys. A: Mater. Sci. Process. (1998){'key': '2023080105151513000_c21', 'first-page': '270', 'volume-title': 'Physics of Semiconductor Devices', 'year': '1981', 'edition': '2nd ed.'}
/ Physics of Semiconductor Devices (1981){'key': '2023080105151513000_c22', 'first-page': 'E81', 'volume-title': 'CRC Handbook of Chemistry and Physics', 'year': '1978', 'edition': '59th ed.'}
/ CRC Handbook of Chemistry and Physics (1978)10.1116/1.591472
/ J. Vac. Sci. Technol. B (2000)10.1016/j.mee.2005.06.004
/ Microelectron. Eng. (2005)10.1063/1.2191829
/ Appl. Phys. Lett. (2006){'key': '2023080105151513000_c26', 'first-page': '431', 'volume-title': 'Surfaces and Interfaces of Solid Materials', 'year': '1995', 'edition': '3rd ed.'}
/ Surfaces and Interfaces of Solid Materials (1995)10.1103/PhysRevB.32.6968
/ Phys. Rev. B (1985)10.1109/TED.2006.875808
/ IEEE Trans. Electron Devices (2006)10.1149/1.2357714
/ J. Electrochem. Soc. (2006)
Dates
Type | When |
---|---|
Created | 18 years, 8 months ago (Dec. 21, 2006, 10:37 a.m.) |
Deposited | 2 years ago (Aug. 1, 2023, 1:29 a.m.) |
Indexed | 2 weeks, 5 days ago (Aug. 6, 2025, 9:55 a.m.) |
Issued | 18 years, 8 months ago (Dec. 18, 2006) |
Published | 18 years, 8 months ago (Dec. 18, 2006) |
Published Online | 18 years, 8 months ago (Dec. 20, 2006) |
Published Print | 18 years, 8 months ago (Dec. 18, 2006) |
@article{Dimoulas_2006, title={Fermi-level pinning and charge neutrality level in germanium}, volume={89}, ISSN={1077-3118}, url={http://dx.doi.org/10.1063/1.2410241}, DOI={10.1063/1.2410241}, number={25}, journal={Applied Physics Letters}, publisher={AIP Publishing}, author={Dimoulas, A. and Tsipas, P. and Sotiropoulos, A. and Evangelou, E. K.}, year={2006}, month=dec }