DOI: 10.1063/1.2362984. Quantitative analysis of ferroelectric domain imaging with piezoresponse force microscopy

Quantitative analysis of ferroelectric domain imaging with piezoresponse force microscopy

10.1063/1.2362984

Crossref journal-article

AIP Publishing

Applied Physics Letters (317)

Abstract

The contrast mechanism for ferroelectric domain imaging via piezoresponse force microscopy (PFM) is investigated. A vectorial description of PFM measurements is presented which takes into account the background caused by the experimental setup. This allows a quantitative, frequency independent analysis of the domain contrast which is in good agreement with the expected values for the piezoelectric deformation of the sample and satisfies the generally required features of PFM imaging.

Bibliography

Jungk, T., Hoffmann, Ã., & Soergel, E. (2006). Quantitative analysis of ferroelectric domain imaging with piezoresponse force microscopy. Applied Physics Letters, 89(16).

Authors 3

Tobias Jungk (first)
Ákos Hoffmann (additional)
Elisabeth Soergel (additional)

References 21 Referenced 115

10.1109/3.161322 / IEEE J. Quantum Electron. (1992)
10.1103/PhysRevLett.84.4345 / Phys. Rev. Lett. (2000)
10.1063/1.2140894 / Appl. Phys. Lett. (2005)
10.1007/s00340-005-1989-9 / Appl. Phys. B: Lasers Opt. (2005)
10.1007/978-3-662-08901-9 / Nanoscale Characterisation of Ferroelectric Materials by Alexe (2004)
T. Jungk, Á. Hoffmann, and E. Soergel, e-print cond-mat/0607313.
10.1103/PhysRevLett.74.4309 / Phys. Rev. Lett. (1995)
10.1063/1.367462 / J. Appl. Phys. (1998)
10.1103/PhysRevB.61.14390 / Phys. Rev. B (2000)
10.1063/1.1454219 / Appl. Phys. Lett. (2002)
10.1063/1.1592307 / Appl. Phys. Lett. (2003)
10.1103/PhysRevB.72.024103 / Phys. Rev. B (2005)
10.1063/1.1861515 / J. Appl. Phys. (2005)
10.1103/PhysRevB.58.5078 / Phys. Rev. B (1998)
10.1063/1.1456967 / Appl. Phys. Lett. (2002)
10.1103/PhysRevB.65.125408 / Phys. Rev. B (2002)
T. Jungk, Á. Hoffmann, and E. Soergel, e-print cond-mat/0602137.
10.1063/1.1497702 / J. Appl. Phys. (2002)
10.1103/PhysRevB.55.R649 / Phys. Rev. B (1997)
10.1007/s003400200818 / Appl. Phys. B: Lasers Opt. (2002)
T. Jungk, Á. Hoffmann, and E. Soergel, e-print cond-mat/0512373.

Dates

Type	When
Created	18 years, 10 months ago (Oct. 18, 2006, 7:03 p.m.)
Deposited	2 years, 2 months ago (June 23, 2023, 5:44 a.m.)
Indexed	4 weeks, 2 days ago (July 30, 2025, 6:48 a.m.)
Issued	18 years, 10 months ago (Oct. 16, 2006)
Published	18 years, 10 months ago (Oct. 16, 2006)
Published Online	18 years, 10 months ago (Oct. 18, 2006)
Published Print	18 years, 10 months ago (Oct. 16, 2006)

Funders 0

None

BibTeX

@article{Jungk_2006, title={Quantitative analysis of ferroelectric domain imaging with piezoresponse force microscopy}, volume={89}, ISSN={1077-3118}, url={http://dx.doi.org/10.1063/1.2362984}, DOI={10.1063/1.2362984}, number={16}, journal={Applied Physics Letters}, publisher={AIP Publishing}, author={Jungk, Tobias and Hoffmann, Ákos and Soergel, Elisabeth}, year={2006}, month=oct }

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