Crossref journal-article
AIP Publishing
Applied Physics Letters (317)
Abstract

Silicon nanoparticles embedded in silica show promising optoelectronic properties, due to quantum confinement and/or radiative interface states that should correlate with the particles’ average size and shape. Here the authors report the combination of electron tomography with plasmon-filtered microscopy in order to reconstruct the three-dimensional morphology of silicon nanoparticles. They find that particles with complex morphologies and high surface to volume ratios are dominant, rather than the commonly assumed near-spherical structures. These results should affect quantum-confined excitons and the interface density of states. Their findings may help to explain the physical origin of the unusually broad photoluminescence bands and efficiencies.

Bibliography

Yurtsever, A., Weyland, M., & Muller, D. A. (2006). Three-dimensional imaging of nonspherical silicon nanoparticles embedded in silicon oxide by plasmon tomography. Applied Physics Letters, 89(15).

Authors 3
  1. Aycan Yurtsever (first)
  2. Matthew Weyland (additional)
  3. David A. Muller (additional)
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Dates
Type When
Created 18 years, 10 months ago (Oct. 17, 2006, 1:20 p.m.)
Deposited 2 years, 1 month ago (June 24, 2023, 1:25 p.m.)
Indexed 3 weeks, 2 days ago (July 30, 2025, 6:47 a.m.)
Issued 18 years, 10 months ago (Oct. 9, 2006)
Published 18 years, 10 months ago (Oct. 9, 2006)
Published Online 18 years, 10 months ago (Oct. 13, 2006)
Published Print 18 years, 10 months ago (Oct. 9, 2006)
Funders 0

None

@article{Yurtsever_2006, title={Three-dimensional imaging of nonspherical silicon nanoparticles embedded in silicon oxide by plasmon tomography}, volume={89}, ISSN={1077-3118}, url={http://dx.doi.org/10.1063/1.2360906}, DOI={10.1063/1.2360906}, number={15}, journal={Applied Physics Letters}, publisher={AIP Publishing}, author={Yurtsever, Aycan and Weyland, Matthew and Muller, David A.}, year={2006}, month=oct }