Abstract
Silicon nanoparticles embedded in silica show promising optoelectronic properties, due to quantum confinement and/or radiative interface states that should correlate with the particles’ average size and shape. Here the authors report the combination of electron tomography with plasmon-filtered microscopy in order to reconstruct the three-dimensional morphology of silicon nanoparticles. They find that particles with complex morphologies and high surface to volume ratios are dominant, rather than the commonly assumed near-spherical structures. These results should affect quantum-confined excitons and the interface density of states. Their findings may help to explain the physical origin of the unusually broad photoluminescence bands and efficiencies.
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Dates
Type | When |
---|---|
Created | 18 years, 10 months ago (Oct. 17, 2006, 1:20 p.m.) |
Deposited | 2 years, 1 month ago (June 24, 2023, 1:25 p.m.) |
Indexed | 3 weeks, 2 days ago (July 30, 2025, 6:47 a.m.) |
Issued | 18 years, 10 months ago (Oct. 9, 2006) |
Published | 18 years, 10 months ago (Oct. 9, 2006) |
Published Online | 18 years, 10 months ago (Oct. 13, 2006) |
Published Print | 18 years, 10 months ago (Oct. 9, 2006) |
@article{Yurtsever_2006, title={Three-dimensional imaging of nonspherical silicon nanoparticles embedded in silicon oxide by plasmon tomography}, volume={89}, ISSN={1077-3118}, url={http://dx.doi.org/10.1063/1.2360906}, DOI={10.1063/1.2360906}, number={15}, journal={Applied Physics Letters}, publisher={AIP Publishing}, author={Yurtsever, Aycan and Weyland, Matthew and Muller, David A.}, year={2006}, month=oct }