Abstract
ZnO nanowires with high crystalline and optical properties are characterized, showing strong effect of the surface defect states. In order to optimize the performance of devices based on these nanowires, a series of complementary metal-oxide semiconductor compatible surface passivation procedures is employed. Electrical transport measurements demonstrate significantly reduced subthreshold swing, high on/off ratio, and unprecedented field effect mobility.
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Dates
Type | When |
---|---|
Created | 18 years, 11 months ago (Sept. 27, 2006, 6:22 p.m.) |
Deposited | 2 years, 1 month ago (July 2, 2023, 3:49 p.m.) |
Indexed | 1 day, 8 hours ago (Aug. 28, 2025, 8:34 a.m.) |
Issued | 18 years, 11 months ago (Sept. 25, 2006) |
Published | 18 years, 11 months ago (Sept. 25, 2006) |
Published Online | 18 years, 11 months ago (Sept. 27, 2006) |
Published Print | 18 years, 11 months ago (Sept. 25, 2006) |
@article{Chang_2006, title={High-performance ZnO nanowire field effect transistors}, volume={89}, ISSN={1077-3118}, url={http://dx.doi.org/10.1063/1.2357013}, DOI={10.1063/1.2357013}, number={13}, journal={Applied Physics Letters}, publisher={AIP Publishing}, author={Chang, Pai-Chun and Fan, Zhiyong and Chien, Chung-Jen and Stichtenoth, Daniel and Ronning, Carsten and Lu, Jia Grace}, year={2006}, month=sep }