Abstract
Honeycomblike network of vertically aligned AlN nanoplatelets was synthesized on etched Si substrate via a simple vapor phase method without catalyst. The nanoplatelets are hexagonal wurtzite AlN and their thickness is 10–100nm. Field emission (FE) measurements showed that this nanostructure has a low turn-on field of 3.2–5.0V∕μm and a threshold field of 7.8–12.1V∕μm at sample-anode distances of 50–100μm. The fluctuation of FE current with density of 10mA∕cm2 over 5h is lower than 3%. The low turn-on and threshold fields and the small fluctuation of current demonstrate that this two-dimensional AlN nanostructure is a promising FE material.
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Dates
Type | When |
---|---|
Created | 18 years, 11 months ago (Aug. 30, 2006, 6:11 p.m.) |
Deposited | 2 years, 2 months ago (June 23, 2023, 1:33 a.m.) |
Indexed | 4 weeks ago (July 30, 2025, 6:47 a.m.) |
Issued | 18 years, 11 months ago (Aug. 28, 2006) |
Published | 18 years, 11 months ago (Aug. 28, 2006) |
Published Online | 18 years, 11 months ago (Aug. 30, 2006) |
Published Print | 18 years, 11 months ago (Aug. 28, 2006) |
@article{Tang_2006, title={Field emission from honeycomblike network of vertically aligned AlN nanoplatelets}, volume={89}, ISSN={1077-3118}, url={http://dx.doi.org/10.1063/1.2337277}, DOI={10.1063/1.2337277}, number={9}, journal={Applied Physics Letters}, publisher={AIP Publishing}, author={Tang, Y. B. and Cong, H. T. and Cheng, H.-M.}, year={2006}, month=aug }