DOI: 10.1063/1.2218321. Application of the interface capacitance model to thin-film relaxors and ferroelectrics

Application of the interface capacitance model to thin-film relaxors and ferroelectrics

10.1063/1.2218321

Crossref journal-article

AIP Publishing

Applied Physics Letters (317)

Abstract

The interface capacitance model is briefly revised. It is emphasized that this is a device model related to the boundary condition for polarization and unable to explain the thickness evolution of the ferroelectric properties. The model can be applied to extract the properties of the film from those measured in the capacitor. The interface parameters are found to be temperature independent. The coupling of the film with the interface and the electrode is shown to result in the measured frequency dependent permittivity totally different from that of the film.

Bibliography

Tyunina, M., & Levoska, J. (2006). Application of the interface capacitance model to thin-film relaxors and ferroelectrics. Applied Physics Letters, 88(26).

Authors 2

M. Tyunina (first)
J. Levoska (additional)

References 24 Referenced 34

10.1103/RevModPhys.77.1083 / Rev. Mod. Phys. (2005)
10.1063/1.346845 / J. Appl. Phys. (1990)
10.1063/1.360122 / J. Appl. Phys. (1995)
10.1063/1.366062 / J. Appl. Phys. (1997)
10.1063/1.1522476 / J. Appl. Phys. (2003)
10.1063/1.1608472 / J. Appl. Phys. (2003)
10.1063/1.1980538 / J. Appl. Phys. (2005)
10.1103/PhysRevB.73.064110 / Phys. Rev. B (2006)
10.1063/1.1356731 / Appl. Phys. Lett. (2001)
10.1103/PhysRevB.8.5126 / Phys. Rev. B (1973)
10.1103/PhysRevB.20.1065 / Phys. Rev. B (1979)
10.1103/PhysRevB.63.144109 / Phys. Rev. B (2001)
10.1103/PhysRevB.66.024102 / Phys. Rev. B (2002)
10.1063/1.121715 / Appl. Phys. Lett. (1998)
10.1088/0953-8984/16/21/002 / J. Phys.: Condens. Matter (2004)
10.1063/1.1759084 / J. Appl. Phys. (2004)
10.1103/PhysRevLett.96.107603 / Phys. Rev. Lett. (2006)
10.1063/1.1633027 / Appl. Phys. Lett. (2003)
10.1103/PhysRevB.63.224102 / Phys. Rev. B (2001)
10.1103/PhysRevB.65.132101 / Phys. Rev. B (2002)
10.1103/PhysRevB.72.104112 / Phys. Rev. B (2005)
10.1103/PhysRevB.68.052102 / Phys. Rev. B (2003)
10.1063/1.1924874 / J. Appl. Phys. (2005)
{'volume-title': 'Impedance Spectroscopy Emphasizing Solid Materials and Systems', 'year': '1987', 'author': 'Macdonald', 'key': '2023062117554948400_c17'} / Impedance Spectroscopy Emphasizing Solid Materials and Systems by Macdonald (1987)

Dates

Type	When
Created	19 years, 2 months ago (June 27, 2006, 7:03 p.m.)
Deposited	2 years, 2 months ago (June 23, 2023, 8:18 p.m.)
Indexed	1 month ago (July 30, 2025, 6:47 a.m.)
Issued	19 years, 2 months ago (June 26, 2006)
Published	19 years, 2 months ago (June 26, 2006)
Published Online	19 years, 2 months ago (June 27, 2006)
Published Print	19 years, 2 months ago (June 26, 2006)

Funders 0

None

BibTeX

@article{Tyunina_2006, title={Application of the interface capacitance model to thin-film relaxors and ferroelectrics}, volume={88}, ISSN={1077-3118}, url={http://dx.doi.org/10.1063/1.2218321}, DOI={10.1063/1.2218321}, number={26}, journal={Applied Physics Letters}, publisher={AIP Publishing}, author={Tyunina, M. and Levoska, J.}, year={2006}, month=jun }

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