Abstract
Bottom-contact organic field-effect transistors (OFETs) based on poly(3-hexylthiophene)-2,5-diyl were fabricated under different process conditions. The devices displayed drastic differences in their ambient-air stability. Whereas it took only about 10min in air for the off current to increase by one order of magnitude in OFETs prepared with chloroform and hexamethyldisilazane, a 120min exposure to air caused only a slight degradation of OFETs prepared using 1,2,4-trichlorobenzene, n-octadecyltrichlorosilane, and a heat treatment. The differences in the film surface morphology were analyzed and possible mechanisms for the enhanced stability are discussed.
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Dates
Type | When |
---|---|
Created | 19 years, 2 months ago (May 31, 2006, 7:51 p.m.) |
Deposited | 2 years, 1 month ago (July 2, 2023, 8:46 p.m.) |
Indexed | 1 month ago (July 30, 2025, 6:46 a.m.) |
Issued | 19 years, 3 months ago (May 29, 2006) |
Published | 19 years, 3 months ago (May 29, 2006) |
Published Online | 19 years, 3 months ago (May 31, 2006) |
Published Print | 19 years, 3 months ago (May 29, 2006) |
@article{Majewski_2006, title={Influence of processing conditions on the stability of poly(3-hexylthiophene)-based field-effect transistors}, volume={88}, ISSN={1077-3118}, url={http://dx.doi.org/10.1063/1.2208938}, DOI={10.1063/1.2208938}, number={22}, journal={Applied Physics Letters}, publisher={AIP Publishing}, author={Majewski, L. A. and Kingsley, J. W. and Balocco, C. and Song, A. M.}, year={2006}, month=may }