DOI: 10.1063/1.2197290. Atomically resolved observation of the quenched Si(111) surface with small amplitude dynamic force microscopy

Atomically resolved observation of the quenched Si(111) surface with small amplitude dynamic force microscopy

10.1063/1.2197290

Crossref journal-article

AIP Publishing

Journal of Applied Physics (317)

Abstract

Metastable reconstructed phases and highly disordered regions of the quenched Si(111) “1×1” phase with many silicon clusters were atomically resolved with a constant frequency mode of small amplitude dynamic force microscopy with the second flexural mode of a commercially available dynamic mode cantilever. Improved sensitivity due to the small amplitude dynamic force microscopy could operate at a relatively far distance from the sample surface with a given resolution and enable highly stable imaging with small interaction forces even on the Si(111) 1×1 metastable phases with silicon clusters. All of the individual atoms in the silicon cluster were atomically observed while avoiding deformations of the sample surface and the tip apex. In the case that the interaction forces of the imaging parameters were intently set to be ten times larger than those for stable imaging, arrangements of adatoms could easily be modified by mechanical interaction forces between the tip and the sample surface. The Si(111)-c(2×8) and √3×√3 phases of the 1×1 domain were found to have different contact potentials, which make a topographic height gap in a constant frequency shift image. An ultrasmall amplitude operation for the selective detection of electrostatic forces revealed that deviations of the observed height in the 1×1 domain were larger than that in the 7×7 domain due to the contact potential difference of the c(2×8) and √3×√3 phases in the atomic level.

Bibliography

Kawai, S., Rose, F., Ishii, T., & Kawakatsu, H. (2006). Atomically resolved observation of the quenched Si(111) surface with small amplitude dynamic force microscopy. Journal of Applied Physics, 99(10).

Authors 4

Shigeki Kawai (first)
Franck Rose (additional)
Takanori Ishii (additional)
Hideki Kawakatsu (additional)

References 37 Referenced 20

{'volume-title': 'Noncontact Atomic Force Microscopy', 'year': '2002', 'key': '2023070100454766400_c1'} / Noncontact Atomic Force Microscopy (2002)
10.1063/1.347347 / J. Appl. Phys. (1991)
10.1126/science.267.5194.68 / Science (1995)
10.1143/JJAP.35.L668 / Jpn. J. Appl. Phys., Part 2 (1996)
10.1143/JJAP.34.L1086 / Jpn. J. Appl. Phys., Part 2 (1995)
10.1088/0957-4484/16/3/013 / Nanotechnology (2005)
10.1103/PhysRevLett.90.226101 / Phys. Rev. Lett. (2003)
10.1103/PhysRevB.58.10835 / Phys. Rev. B (1998)
10.1126/science.289.5478.422 / Science (2000)
10.1103/PhysRevLett.89.266105 / Phys. Rev. Lett. (2002)
10.1063/1.1923200 / Appl. Phys. Lett. (2005)
10.1063/1.1389785 / Appl. Phys. Lett. (2001)
10.1126/science.1099730 / Science (2004)
10.1103/PhysRevLett.57.1020 / Phys. Rev. Lett. (1986)
10.1116/1.577071 / J. Vac. Sci. Technol. A (1990)
10.1103/PhysRevLett.72.1862 / Phys. Rev. Lett. (1994)
10.1103/PhysRevB.53.12907 / Phys. Rev. B (1996)
10.1016/S0039-6028(96)01589-0 / Surf. Sci. (1997)
10.1016/S0039-6028(98)00398-7 / Surf. Sci. (1998)
10.1103/PhysRevLett.83.120 / Phys. Rev. Lett. (1999)
10.1143/JJAP.40.L986 / Jpn. J. Appl. Phys., Part 2 (2001)
10.1016/S0169-4332(98)00541-8 / Appl. Surf. Sci. (1999)
10.1063/1.1994896 / Rev. Sci. Instrum. (2005)
{'key': '2023070100454766400_c24'}
10.1063/1.2189193 / Appl. Phys. Lett. (2006)
10.1063/1.2112203 / Appl. Phys. Lett. (2005)
{'key': '2023070100454766400_c27'}
10.1088/0957-4484/15/2/017 / Nanotechnology (2004)
10.1088/0957-4484/11/3/306 / Nanotechnology (2000)
{'key': '2023070100454766400_c30'}
10.1016/0039-6028(89)90256-2 / Surf. Sci. (1989)
10.1143/JJAP.34.L145 / Jpn. J. Appl. Phys., Part 2 (1995)
10.1063/1.2006388 / Rev. Sci. Instrum. (2005)
10.1103/PhysRevB.56.16010 / Phys. Rev. B (1997)
10.1016/S0039-6028(02)01646-1 / Surf. Sci. (2002)
10.1103/PhysRevLett.93.266102 / Phys. Rev. Lett. (2004)
10.1143/JJAP.38.192 / Jpn. J. Appl. Phys., Part 1 (1999)

Dates

Type	When
Created	19 years, 2 months ago (June 12, 2006, 12:13 p.m.)
Deposited	2 years, 2 months ago (June 30, 2023, 8:45 p.m.)
Indexed	1 month ago (July 30, 2025, 6:46 a.m.)
Issued	19 years, 3 months ago (May 15, 2006)
Published	19 years, 3 months ago (May 15, 2006)
Published Online	19 years, 3 months ago (May 30, 2006)
Published Print	19 years, 3 months ago (May 15, 2006)

Funders 0

None

BibTeX

@article{Kawai_2006, title={Atomically resolved observation of the quenched Si(111) surface with small amplitude dynamic force microscopy}, volume={99}, ISSN={1089-7550}, url={http://dx.doi.org/10.1063/1.2197290}, DOI={10.1063/1.2197290}, number={10}, journal={Journal of Applied Physics}, publisher={AIP Publishing}, author={Kawai, Shigeki and Rose, Franck and Ishii, Takanori and Kawakatsu, Hideki}, year={2006}, month=may }

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