Crossref journal-article
AIP Publishing
Applied Physics Letters (317)
Abstract

Effects of interfacial dislocations on the properties of ferroelectric thin films are investigated, using the dynamic Ginzburg–Landau equation. Our results confirm the existence of a dead layer near the film/substrate interface. Due to the combined effects of the dislocations and the near-surface eigenstrain relaxation, the ferroelectric properties of about one-third of the film volume suffers.

Bibliography

Zheng, Y., Wang, B., & Woo, C. H. (2006). Simulation of interface dislocations effect on polarization distribution of ferroelectric thin films. Applied Physics Letters, 88(9).

Authors 3
  1. Yue Zheng (first)
  2. Biao Wang (additional)
  3. C. H. Woo (additional)
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Dates
Type When
Created 19 years, 6 months ago (Feb. 28, 2006, 6:16 p.m.)
Deposited 2 years, 2 months ago (July 2, 2023, 11:19 p.m.)
Indexed 1 month ago (July 30, 2025, 6:45 a.m.)
Issued 19 years, 6 months ago (Feb. 27, 2006)
Published 19 years, 6 months ago (Feb. 27, 2006)
Published Online 19 years, 6 months ago (March 1, 2006)
Published Print 19 years, 6 months ago (Feb. 27, 2006)
Funders 0

None

@article{Zheng_2006, title={Simulation of interface dislocations effect on polarization distribution of ferroelectric thin films}, volume={88}, ISSN={1077-3118}, url={http://dx.doi.org/10.1063/1.2177365}, DOI={10.1063/1.2177365}, number={9}, journal={Applied Physics Letters}, publisher={AIP Publishing}, author={Zheng, Yue and Wang, Biao and Woo, C. H.}, year={2006}, month=feb }