Abstract
Electrical transport measurements were conducted on semiconducting nanowires and three distinct current-voltage (I-V) characteristics were observed, i.e., almost symmetric, almost rectifying, and almost linear. These I-V characteristics were modeled by treating the transport in the nanowire as in a metal-semiconductor-metal structure involving two Schottky barriers and a resistor in between these barriers, and the transport is shown to be dominated by the reverse-biased Schottky barrier under low bias and by the semiconducting nanowire at large bias. In contrast to the conventional Schottky diode, the reverse current in the nano-Schottky barrier structure is not negligible and the current is largely tunneling rather than thermionic. Experimental I-V curves are reproduced very well using our model, and a method for extracting nanowire resistance, electron density, and mobility is proposed and applied to ZnO, CdS, and Bi2S3 nanowires.
References
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Dates
Type | When |
---|---|
Created | 19 years, 6 months ago (Feb. 13, 2006, 6:02 p.m.) |
Deposited | 2 years, 2 months ago (June 23, 2023, 5:32 a.m.) |
Indexed | 3 weeks, 3 days ago (July 30, 2025, 6:46 a.m.) |
Issued | 19 years, 6 months ago (Feb. 13, 2006) |
Published | 19 years, 6 months ago (Feb. 13, 2006) |
Published Online | 19 years, 6 months ago (Feb. 14, 2006) |
Published Print | 19 years, 6 months ago (Feb. 13, 2006) |
@article{Zhang_2006, title={Current-voltage characteristics and parameter retrieval of semiconducting nanowires}, volume={88}, ISSN={1077-3118}, url={http://dx.doi.org/10.1063/1.2177362}, DOI={10.1063/1.2177362}, number={7}, journal={Applied Physics Letters}, publisher={AIP Publishing}, author={Zhang, Z. Y. and Jin, C. H. and Liang, X. L. and Chen, Q. and Peng, L.-M.}, year={2006}, month=feb }