DOI: 10.1063/1.2149174. Temperature control of electromigration to form gold nanogap junctions

Temperature control of electromigration to form gold nanogap junctions

10.1063/1.2149174

Crossref journal-article

AIP Publishing

Applied Physics Letters (317)

Abstract

Controlled electromigration of gold nanowires of different cross-sectional areas to form nanogap junctions is studied using a feedback method. A linear correlation between the cross-sectional area of the gold nanowires and the power dissipated in the junction during electromigration is observed, indicating that the feedback mechanism operates primarily by controlling the temperature of the junction during electromigration. We also show that the role of the external feedback circuit is to prevent thermal runaway; minimization of series resistance allows controlled electromigration to a significant range of junction resistances with a simple voltage ramp.

Bibliography

Esen, G., & Fuhrer, M. S. (2005). Temperature control of electromigration to form gold nanogap junctions. Applied Physics Letters, 87(26).

Authors 2

G. Esen (first)
M. S. Fuhrer (additional)

References 11 Referenced 103

10.1088/0268-1242/12/10/002 / Semicond. Sci. Technol. (1997)
10.1063/1.124354 / Appl. Phys. Lett. (1999)
10.1038/35024031 / Nature (London) (2000)
10.1088/0957-4484/14/7/313 / Nanotechnology (2003)
10.1063/1.1857095 / Appl. Phys. Lett. (2005)
10.1021/nl050799i / Nano Lett. (2005)
10.1109/PROC.1969.7340 / Proc. IEEE (1969)
10.1109/24.294986 / IEEE Trans. Reliab. (1994)
{'first-page': '142', 'volume-title': 'IEEE 2002 Inter Society Conference on Thermal Phenomena', 'year': '2000', 'key': '2023070220202967900_c9'} / IEEE 2002 Inter Society Conference on Thermal Phenomena (2000)
{'edition': '4th ed.', 'volume-title': 'Introduction to Heat Transfer', 'year': '2002', 'key': '2023070220202967900_c10'} / Introduction to Heat Transfer (2002)
10.1063/1.1378340 / Rev. Sci. Instrum. (2001)

Dates

Type	When
Created	19 years, 8 months ago (Dec. 21, 2005, 10:49 a.m.)
Deposited	2 years, 1 month ago (July 2, 2023, 4:20 p.m.)
Indexed	4 weeks, 1 day ago (July 30, 2025, 6:46 a.m.)
Issued	19 years, 8 months ago (Dec. 19, 2005)
Published	19 years, 8 months ago (Dec. 19, 2005)
Published Online	19 years, 8 months ago (Dec. 19, 2005)
Published Print	19 years, 8 months ago (Dec. 26, 2005)

Funders 0

None

BibTeX

@article{Esen_2005, title={Temperature control of electromigration to form gold nanogap junctions}, volume={87}, ISSN={1077-3118}, url={http://dx.doi.org/10.1063/1.2149174}, DOI={10.1063/1.2149174}, number={26}, journal={Applied Physics Letters}, publisher={AIP Publishing}, author={Esen, G. and Fuhrer, M. S.}, year={2005}, month=dec }

JSON

{
  "indexed": {
    "date-parts": [
      [
        2025,
        7,
        30
      ]
    ],
    "date-time": "2025-07-30T10:46:35Z",
    "timestamp": 1753872395178,
    "version": "3.41.2"
  },
  "reference-count": 11,
  "publisher": "AIP Publishing",
  "issue": "26",
  "content-domain": {
    "domain": [
      "pubs.aip.org"
    ],
    "crossmark-restriction": true
  },
  "published-print": {
    "date-parts": [
      [
        2005,
        12,
        26
      ]
    ]
  },
  "abstract": "<jats:p>Controlled electromigration of gold nanowires of different cross-sectional areas to form nanogap junctions is studied using a feedback method. A linear correlation between the cross-sectional area of the gold nanowires and the power dissipated in the junction during electromigration is observed, indicating that the feedback mechanism operates primarily by controlling the temperature of the junction during electromigration. We also show that the role of the external feedback circuit is to prevent thermal runaway; minimization of series resistance allows controlled electromigration to a significant range of junction resistances with a simple voltage ramp.</jats:p>",
  "DOI": "10.1063/1.2149174",
  "type": "journal-article",
  "created": {
    "date-parts": [
      [
        2005,
        12,
        21
      ]
    ],
    "date-time": "2005-12-21T15:49:00Z",
    "timestamp": 1135180140000
  },
  "update-policy": "https://doi.org/10.1063/aip-crossmark-policy-page",
  "source": "Crossref",
  "is-referenced-by-count": 103,
  "title": "Temperature control of electromigration to form gold nanogap junctions",
  "prefix": "10.1063",
  "volume": "87",
  "author": [
    {
      "given": "G.",
      "family": "Esen",
      "sequence": "first",
      "affiliation": [
        {
          "name": "University of Maryland Department of Physics and Center for Superconductivity Research, , College Park, Maryland 20742-4111"
        }
      ]
    },
    {
      "given": "M. S.",
      "family": "Fuhrer",
      "sequence": "additional",
      "affiliation": [
        {
          "name": "University of Maryland Department of Physics and Center for Superconductivity Research, , College Park, Maryland 20742-4111"
        }
      ]
    }
  ],
  "member": "317",
  "published-online": {
    "date-parts": [
      [
        2005,
        12,
        19
      ]
    ]
  },
  "reference": [
    {
      "key": "2023070220202967900_c1",
      "doi-asserted-by": "publisher",
      "first-page": "1177",
      "DOI": "10.1088/0268-1242/12/10/002",
      "volume": "12",
      "year": "1997",
      "journal-title": "Semicond. Sci. Technol."
    },
    {
      "key": "2023070220202967900_c2",
      "doi-asserted-by": "publisher",
      "first-page": "301",
      "DOI": "10.1063/1.124354",
      "volume": "75",
      "year": "1999",
      "journal-title": "Appl. Phys. Lett."
    },
    {
      "key": "2023070220202967900_c3",
      "doi-asserted-by": "publisher",
      "first-page": "57",
      "DOI": "10.1038/35024031",
      "volume": "407",
      "year": "2000",
      "journal-title": "Nature (London)"
    },
    {
      "key": "2023070220202967900_c4",
      "doi-asserted-by": "publisher",
      "first-page": "772",
      "DOI": "10.1088/0957-4484/14/7/313",
      "volume": "14",
      "year": "2003",
      "journal-title": "Nanotechnology"
    },
    {
      "key": "2023070220202967900_c5",
      "doi-asserted-by": "publisher",
      "first-page": "043109",
      "DOI": "10.1063/1.1857095",
      "volume": "86",
      "year": "2005",
      "journal-title": "Appl. Phys. Lett."
    },
    {
      "key": "2023070220202967900_c6",
      "doi-asserted-by": "crossref",
      "first-page": "1685",
      "DOI": "10.1021/nl050799i",
      "volume": "5",
      "year": "2005",
      "journal-title": "Nano Lett."
    },
    {
      "key": "2023070220202967900_c7",
      "doi-asserted-by": "crossref",
      "first-page": "1587",
      "DOI": "10.1109/PROC.1969.7340",
      "volume": "57",
      "year": "1969",
      "journal-title": "Proc. IEEE"
    },
    {
      "key": "2023070220202967900_c8",
      "doi-asserted-by": "publisher",
      "first-page": "186",
      "DOI": "10.1109/24.294986",
      "volume": "43",
      "year": "1994",
      "journal-title": "IEEE Trans. Reliab."
    },
    {
      "first-page": "142",
      "volume-title": "IEEE 2002 Inter Society Conference on Thermal Phenomena",
      "year": "2000",
      "key": "2023070220202967900_c9"
    },
    {
      "edition": "4th ed.",
      "volume-title": "Introduction to Heat Transfer",
      "year": "2002",
      "key": "2023070220202967900_c10"
    },
    {
      "key": "2023070220202967900_c11",
      "doi-asserted-by": "publisher",
      "first-page": "2996",
      "DOI": "10.1063/1.1378340",
      "volume": "72",
      "year": "2001",
      "journal-title": "Rev. Sci. Instrum."
    }
  ],
  "container-title": "Applied Physics Letters",
  "original-title": [],
  "language": "en",
  "link": [
    {
      "URL": "https://pubs.aip.org/aip/apl/article-pdf/doi/10.1063/1.2149174/13827126/263101_1_online.pdf",
      "content-type": "application/pdf",
      "content-version": "vor",
      "intended-application": "syndication"
    },
    {
      "URL": "https://pubs.aip.org/aip/apl/article-pdf/doi/10.1063/1.2149174/13827126/263101_1_online.pdf",
      "content-type": "unspecified",
      "content-version": "vor",
      "intended-application": "similarity-checking"
    }
  ],
  "deposited": {
    "date-parts": [
      [
        2023,
        7,
        2
      ]
    ],
    "date-time": "2023-07-02T20:20:35Z",
    "timestamp": 1688329235000
  },
  "score": 1,
  "resource": {
    "primary": {
      "URL": "https://pubs.aip.org/apl/article/87/26/263101/330329/Temperature-control-of-electromigration-to-form"
    }
  },
  "subtitle": [],
  "short-title": [],
  "issued": {
    "date-parts": [
      [
        2005,
        12,
        19
      ]
    ]
  },
  "references-count": 11,
  "journal-issue": {
    "issue": "26",
    "published-print": {
      "date-parts": [
        [
          2005,
          12,
          26
        ]
      ]
    }
  },
  "URL": "http://dx.doi.org/10.1063/1.2149174",
  "relation": {},
  "ISSN": [
    "0003-6951",
    "1077-3118"
  ],
  "subject": [],
  "published-other": {
    "date-parts": [
      [
        2005,
        12,
        26
      ]
    ]
  },
  "published": {
    "date-parts": [
      [
        2005,
        12,
        19
      ]
    ]
  },
  "article-number": "263101"
}