DOI: 10.1063/1.1925774. Observation of ultrahigh quality factor in a semiconductor microcavity

Observation of ultrahigh quality factor in a semiconductor microcavity

10.1063/1.1925774

Crossref journal-article

AIP Publishing

Applied Physics Letters (317)

Abstract

Observation of a very high-quality factor (Q) of ∼30,000 is reported for a planar semiconductor microcavity grown by molecular-beam epitaxy using in situ optical monitoring. The very high Qs are measured in pillars of 5–10μm diameter, and are approximately a factor of 3 higher than measured in planar structures before etching. The higher values in the pillars are ascribed to the elimination of the effects of in-plane dispersion, diffraction, and lateral inhomogeneities, thus allowing the intrinsic Q of the planar structure to be observed. Spectrally resolved mode mapping is reported, accounting qualitatively for the decrease of Q with increasing mode number in the pillars.

Bibliography

Sanvitto, D., Daraei, A., Tahraoui, A., Hopkinson, M., Fry, P. W., Whittaker, D. M., & Skolnick, M. S. (2005). Observation of ultrahigh quality factor in a semiconductor microcavity. Applied Physics Letters, 86(19).

Authors 7

D. Sanvitto (first)
A. Daraei (additional)
A. Tahraoui (additional)
M. Hopkinson (additional)
P. W. Fry (additional)
D. M. Whittaker (additional)
M. S. Skolnick (additional)

References 13 Referenced 28

10.1103/PhysRev.69.37 / Phys. Rev. (1946)
10.1103/PhysRevLett.81.1110 / Phys. Rev. Lett. (1998)
10.1063/1.1767983 / J. Appl. Phys. (2004)
10.1038/nature02969 / Nature (London) (2004)
10.1038/nature03119 / Nature (London) (2004)
E. Peter, P. Senellart, D. Martrou, A. Lemaître, and J. Bloch, arXiv:quant-ph/0411076 (2004).
10.1088/0268-1242/13/7/003 / Semicond. Sci. Technol. (1998)
10.1063/1.123407 / Appl. Phys. Lett. (1999)
10.1063/1.112877 / Appl. Phys. Lett. (1994)
10.1016/S1386-9477(00)00187-9 / Physica E (Amsterdam) (2001)
10.1063/1.1759375 / Appl. Phys. Lett. (2004)
{'key': '2023072407505418000_c12'}
{'volume-title': 'Physics of Semiconductor Heterostructures', 'year': '1993', 'first-page': '634', 'key': '2023072407505418000_c13'} / Physics of Semiconductor Heterostructures (1993)

Dates

Type	When
Created	20 years, 3 months ago (May 4, 2005, 11:34 p.m.)
Deposited	2 years, 1 month ago (July 24, 2023, 3:51 a.m.)
Indexed	4 weeks, 2 days ago (July 30, 2025, 6:45 a.m.)
Issued	20 years, 3 months ago (May 4, 2005)
Published	20 years, 3 months ago (May 4, 2005)
Published Online	20 years, 3 months ago (May 4, 2005)
Published Print	20 years, 3 months ago (May 9, 2005)

Funders 0

None

BibTeX

@article{Sanvitto_2005, title={Observation of ultrahigh quality factor in a semiconductor microcavity}, volume={86}, ISSN={1077-3118}, url={http://dx.doi.org/10.1063/1.1925774}, DOI={10.1063/1.1925774}, number={19}, journal={Applied Physics Letters}, publisher={AIP Publishing}, author={Sanvitto, D. and Daraei, A. and Tahraoui, A. and Hopkinson, M. and Fry, P. W. and Whittaker, D. M. and Skolnick, M. S.}, year={2005}, month=may }

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