DOI: 10.1063/1.1850652. Atomic force microscopy-based experimental setup for studying domain switching dynamics in ferroelectric capacitors

Atomic force microscopy-based experimental setup for studying domain switching dynamics in ferroelectric capacitors

10.1063/1.1850652

Crossref journal-article

AIP Publishing

Review of Scientific Instruments (317)

Abstract

This article describes an experimental setup for combined measurements of domain switching dynamics and switching currents in micrometer scale ferroelectric capacitors. The setup is based on a commercial atomic force microscope (AFM) that is equipped with a piezoresponse mode for domain imaging and with a wide bandwidth current amplifier for switching current recording. The setup allows combined domain/current measurements in capacitors as small as 1μm2 with switching times resolved down to 10ns. The incorporation of switching current measurement capability into piezoresponse AFM makes detailed analysis of switching behavior in ferroelectric memory devices possible.

Bibliography

Dehoff, C., Rodriguez, B. J., Kingon, A. I., Nemanich, R. J., Gruverman, A., & Cross, J. S. (2005). Atomic force microscopy-based experimental setup for studying domain switching dynamics in ferroelectric capacitors. Review of Scientific Instruments, 76(2).

Authors 6

C. Dehoff (first)
B. J. Rodriguez (additional)
A. I. Kingon (additional)
R. J. Nemanich (additional)
A. Gruverman (additional)
J. S. Cross (additional)

References 24 Referenced 42

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Dates

Type	When
Created	20 years, 6 months ago (Jan. 24, 2005, 6:05 p.m.)
Deposited	2 years ago (Aug. 1, 2023, 5:44 p.m.)
Indexed	3 weeks, 2 days ago (July 30, 2025, 6:45 a.m.)
Issued	20 years, 6 months ago (Jan. 25, 2005)
Published	20 years, 6 months ago (Jan. 25, 2005)
Published Online	20 years, 6 months ago (Jan. 25, 2005)
Published Print	20 years, 6 months ago (Feb. 1, 2005)

Funders 0

None

BibTeX

@article{Dehoff_2005, title={Atomic force microscopy-based experimental setup for studying domain switching dynamics in ferroelectric capacitors}, volume={76}, ISSN={1089-7623}, url={http://dx.doi.org/10.1063/1.1850652}, DOI={10.1063/1.1850652}, number={2}, journal={Review of Scientific Instruments}, publisher={AIP Publishing}, author={Dehoff, C. and Rodriguez, B. J. and Kingon, A. I. and Nemanich, R. J. and Gruverman, A. and Cross, J. S.}, year={2005}, month=jan }

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