DOI: 10.1063/1.1826229. Structure of pentacene thin films

10.1063/1.1826229

Crossref journal-article

AIP Publishing

Applied Physics Letters (317)

Abstract

Grazing incidence x-ray diffraction, x-ray reflectivity and atomic force microscopy have been performed to study the structure of pentacene thin films on oxidized Si substrates from submonolayer to multilayer coverages. The volume of the unit cell in the thin film phase is almost identical to that of the bulk phase, thus the molecular packing efficiency is effectively the same in both phases. The structure forming from the first monolayer remains the same for films at least 190Å thick. The in-plane structure of the submonolayer islands also remains unchanged within a substrate temperature range of 0&lt;Tsub&lt;45°C while the island size changes by more than a factor of 4.

Bibliography

Ruiz, R., Mayer, A. C., Malliaras, G. G., Nickel, B., Scoles, G., Kazimirov, A., Kim, H., Headrick, R. L., & Islam, Z. (2004). Structure of pentacene thin films. Applied Physics Letters, 85(21), 4926â4928.

Authors 9

Ricardo Ruiz (first)
Alex C. Mayer (additional)
George G. Malliaras (additional)
Bert Nickel (additional)
Giacinto Scoles (additional)
Alexander Kazimirov (additional)
Hyunjung Kim (additional)
Randall L. Headrick (additional)
Zahirul Islam (additional)

References 15 Referenced 158

10.1002/1521-4095(20020116)14:2<99::AID-ADMA99>3.0.CO;2-9 / Adv. Mater. (Weinheim, Ger.) (2002)
10.1107/S0365110X62000699 / Acta Crystallogr. (1962)
10.1002/(SICI)1521-3765(19991105)5:11<3399::AID-CHEM3399>3.0.CO;2-V / Chem.-Eur. J. (1999)
10.1063/1.363032 / J. Appl. Phys. (1996)
10.1063/1.352004 / J. Appl. Phys. (1992)
10.1021/ja049726b / J. Am. Chem. Soc. (2004)
10.1107/S0021889803025093 / J. Appl. Crystallogr. (2004)
{'key': '2024020404345904000_c8', 'first-page': '397', 'volume': '734', 'year': '2003', 'journal-title': 'Mater. Res. Soc. Symp. Proc.'} / Mater. Res. Soc. Symp. Proc. (2003)
10.1103/PhysRevB.67.125406 / Phys. Rev. B (2003)
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10.1103/PhysRevLett.56.1144 / Phys. Rev. Lett. (1986)
10.1103/PhysRevB.68.115428 / Phys. Rev. B (2003)
{'key': '2024020404345904000_c13', 'volume-title': 'International Tables for X-Ray Crystallography', 'author': 'I. U. of Crystallography', 'year': '1952'} / International Tables for X-Ray Crystallography by I. U. of Crystallography (1952)
10.1063/1.1491009 / Appl. Phys. Lett. (2002)
10.1088/0034-4885/47/4/002 / Rep. Prog. Phys. (1984)

Dates

Type	When
Created	20 years, 9 months ago (Nov. 23, 2004, 10:21 p.m.)
Deposited	1 year, 7 months ago (Feb. 3, 2024, 11:35 p.m.)
Indexed	5 days, 2 hours ago (Sept. 2, 2025, 6:37 a.m.)
Issued	20 years, 9 months ago (Nov. 22, 2004)
Published	20 years, 9 months ago (Nov. 22, 2004)
Published Print	20 years, 9 months ago (Nov. 22, 2004)

Funders 0

None

BibTeX

@article{Ruiz_2004, title={Structure of pentacene thin films}, volume={85}, ISSN={1077-3118}, url={http://dx.doi.org/10.1063/1.1826229}, DOI={10.1063/1.1826229}, number={21}, journal={Applied Physics Letters}, publisher={AIP Publishing}, author={Ruiz, Ricardo and Mayer, Alex C. and Malliaras, George G. and Nickel, Bert and Scoles, Giacinto and Kazimirov, Alexander and Kim, Hyunjung and Headrick, Randall L. and Islam, Zahirul}, year={2004}, month=nov, pages={4926–4928} }

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