DOI: 10.1063/1.1812372. Nonlinear transport imaging by scanning impedance microscopy

Nonlinear transport imaging by scanning impedance microscopy

10.1063/1.1812372

Crossref journal-article

AIP Publishing

Applied Physics Letters (317)

Abstract

Scanning probe microscopy is an established tool for characterization of the linear static and frequency-dependent lateral electronic transport in materials and devices at the nanoscale. In this letter, a modified scanning impedance microscopy (SIM) technique is proposed to extend the nanoscale transport measurements of intrinsic material properties to the nonlinear regime, through detection of frequency harmonics, and exemplified by a detailed study of a prototypical metal–semiconductor interface. The imaging mechanism, surface–tip contrast transfer, optimal experimental conditions, and potential applications of nonlinear SIM are discussed. This technique can be readily transferred to most cantilever-based scanning probe microscopes.

Bibliography

Shin, J., Meunier, V., Baddorf, A. P., & Kalinin, S. V. (2004). Nonlinear transport imaging by scanning impedance microscopy. Applied Physics Letters, 85(18), 4240â4242.

Authors 4

J. Shin (first)
V. Meunier (additional)
A. P. Baddorf (additional)
S. V. Kalinin (additional)

References 11 Referenced 17

{'key': '2024020404254212600_c1', 'volume-title': 'Physics of Semiconductor Devices', 'year': '1981'} / Physics of Semiconductor Devices (1981)
{'key': '2024020404254212600_c2', 'volume-title': 'Principles of Electronic Ceramics', 'year': '1990'} / Principles of Electronic Ceramics (1990)
10.1021/ar980112j / Acc. Chem. Res. (2000)
10.1088/0034-4885/65/2/202 / Rep. Prog. Phys. (2002)
10.1038/35009026 / Nature (London) (2000)
10.1063/1.114867 / Appl. Phys. Lett. (1995)
10.1063/1.1427145 / J. Appl. Phys. (2002)
10.1063/1.125923 / Appl. Phys. Lett. (2000)
{'key': '2024020404254212600_c9'}
10.1063/1.1350627 / Appl. Phys. Lett. (2001)
{'key': '2024020404254212600_c11', 'volume-title': 'Impedance Microscopy: Emphasizing Solid Materials and Systems', 'author': 'Macdonald', 'year': '1987'} / Impedance Microscopy: Emphasizing Solid Materials and Systems by Macdonald (1987)

Dates

Type	When
Created	20 years, 9 months ago (Nov. 3, 2004, 6:48 p.m.)
Deposited	1 year, 6 months ago (Feb. 3, 2024, 11:25 p.m.)
Indexed	1 year, 6 months ago (Feb. 3, 2024, 11:40 p.m.)
Issued	20 years, 10 months ago (Nov. 1, 2004)
Published	20 years, 10 months ago (Nov. 1, 2004)
Published Print	20 years, 10 months ago (Nov. 1, 2004)

Funders 0

None

BibTeX

@article{Shin_2004, title={Nonlinear transport imaging by scanning impedance microscopy}, volume={85}, ISSN={1077-3118}, url={http://dx.doi.org/10.1063/1.1812372}, DOI={10.1063/1.1812372}, number={18}, journal={Applied Physics Letters}, publisher={AIP Publishing}, author={Shin, J. and Meunier, V. and Baddorf, A. P. and Kalinin, S. V.}, year={2004}, month=nov, pages={4240–4242} }

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