DOI: 10.1063/1.1805701. Transmission electron microscopy and transistor characteristics of the same carbon nanotube

Transmission electron microscopy and transistor characteristics of the same carbon nanotube

10.1063/1.1805701

Crossref journal-article

AIP Publishing

Applied Physics Letters (317)

Abstract

A technique is presented which allows one to combine TEM investigations with transport measurements and potentially a wide range of other investigations on the same nanoobject. Using this technique, we have obtained high-resolution transmission electron microscopy images and transport investigations including transfer characteristics on the same single-walled carbon nanotube. The transfer characteristics show ambipolar transport. This observation is discussed taking into account TEM information on tube diameter, number of tubes in the bundle, and possible tube filling with fullerenes (peapods).

Bibliography

Meyer, J. C., Obergfell, D., Roth, S., Yang, S., & Yang, S. (2004). Transmission electron microscopy and transistor characteristics of the same carbon nanotube. Applied Physics Letters, 85(14), 2911â2913.

Authors 5

Jannik C. Meyer (first)
Dirk Obergfell (additional)
Siegmar Roth (additional)
Shihe Yang (additional)
Shangfeng Yang (additional)

References 16 Referenced 24

10.1126/science.284.5419.1508 / Science (1999)
10.1103/PhysRevLett.89.155501 / Phys. Rev. Lett. (2002)
{'key': '2024020404075254100_c3', 'first-page': '1437', 'volume': '104', 'year': '2000', 'journal-title': 'J. Phys. Chem. B'} / J. Phys. Chem. B (2000)
10.1103/PhysRevLett.85.5384 / Phys. Rev. Lett. (2000)
10.1126/science.290.5500.2280 / Science (2000)
10.1063/1.1419054 / Appl. Phys. Lett. (2001)
10.1038/4151005a / Nature (London) (2002)
10.1063/1.1522482 / Appl. Phys. Lett. (2002)
10.1088/0957-4484/14/2/344 / Nanotechnology (2003)
{'key': '2024020404075254100_c10', 'volume-title': 'Physical Properties of Carbon Nanotubes', 'year': '1998'} / Physical Properties of Carbon Nanotubes (1998)
10.1063/1.1448850 / Appl. Phys. Lett. (2002)
10.1103/PhysRevLett.78.1932 / Phys. Rev. Lett. (1997)
10.1103/PhysRevLett.84.5604 / Phys. Rev. Lett. (2000)
10.1126/science.1058853 / Science (2001)
10.1103/PhysRevLett.87.256805 / Phys. Rev. Lett. (2001)
10.1103/PhysRevLett.89.106801 / Phys. Rev. Lett. (2002)

Dates

Type	When
Created	20 years, 10 months ago (Oct. 14, 2004, 6:14 p.m.)
Deposited	1 year, 7 months ago (Feb. 3, 2024, 11:08 p.m.)
Indexed	1 year, 6 months ago (Feb. 19, 2024, 3:27 p.m.)
Issued	20 years, 11 months ago (Oct. 4, 2004)
Published	20 years, 11 months ago (Oct. 4, 2004)
Published Print	20 years, 11 months ago (Oct. 4, 2004)

Funders 0

None

BibTeX

@article{Meyer_2004, title={Transmission electron microscopy and transistor characteristics of the same carbon nanotube}, volume={85}, ISSN={1077-3118}, url={http://dx.doi.org/10.1063/1.1805701}, DOI={10.1063/1.1805701}, number={14}, journal={Applied Physics Letters}, publisher={AIP Publishing}, author={Meyer, Jannik C. and Obergfell, Dirk and Roth, Siegmar and Yang, Shihe and Yang, Shangfeng}, year={2004}, month=oct, pages={2911–2913} }

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