Crossref journal-article
AIP Publishing
Applied Physics Letters (317)
Abstract

Attachment losses can play a role in limiting the quality factors of micro/nanomechanical oscillators. The existing theoretical results in this regard are applicable to highly idealized scenarios. The theory has been extended in two important directions: the width of the cantilever is considered to be small relative to a wavelength as opposed to large, and the base is allowed to have finite thickness. These extensions result in significant, in many cases order of magnitude, changes in the estimates of attachment loss. Simple formulas for Q−1 covering most of the parameter range are given.

Bibliography

Photiadis, D. M., & Judge, J. A. (2004). Attachment losses of high Q oscillators. Applied Physics Letters, 85(3), 482–484.

Authors 2
  1. Douglas M. Photiadis (first)
  2. John A. Judge (additional)
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Dates
Type When
Created 21 years, 1 month ago (July 14, 2004, 6:10 p.m.)
Deposited 1 year, 7 months ago (Feb. 3, 2024, 10:35 p.m.)
Indexed 19 hours, 44 minutes ago (Sept. 4, 2025, 9:16 a.m.)
Issued 21 years, 1 month ago (July 19, 2004)
Published 21 years, 1 month ago (July 19, 2004)
Published Print 21 years, 1 month ago (July 19, 2004)
Funders 0

None

@article{Photiadis_2004, title={Attachment losses of high Q oscillators}, volume={85}, ISSN={1077-3118}, url={http://dx.doi.org/10.1063/1.1773928}, DOI={10.1063/1.1773928}, number={3}, journal={Applied Physics Letters}, publisher={AIP Publishing}, author={Photiadis, Douglas M. and Judge, John A.}, year={2004}, month=jul, pages={482–484} }