DOI: 10.1063/1.1755142. REFLECTION HIGH-ENERGY ELECTRON DIFFRACTION AND X-RAY EMISSION ANALYSIS OF SURFACES AND THEIR REACTION PRODUCTS

REFLECTION HIGH-ENERGY ELECTRON DIFFRACTION AND X-RAY EMISSION ANALYSIS OF SURFACES AND THEIR REACTION PRODUCTS

10.1063/1.1755142

Crossref journal-article

AIP Publishing

Applied Physics Letters (317)

Abstract

An apparatus is described in which it is possible to obtain simultaneous reflection high-energy electron diffraction and x-ray emission measurements from surfaces. The ultimate vacuum in the electron diffraction section of the apparatus is &lt;10−9 torr so that both chemical and crystallographic information about clean surfaces and surfaces with adsorbed monolayers or thin film reaction products can be acquired. The sensitivity of the apparatus is illustrated with oxygen on the (001) surface of iron.

Bibliography

Sewell, P. B., & Cohen, M. (1967). REFLECTION HIGH-ENERGY ELECTRON DIFFRACTION AND X-RAY EMISSION ANALYSIS OF SURFACES AND THEIR REACTION PRODUCTS. Applied Physics Letters, 11(9), 298â299.

Authors 2

P. B. Sewell (first)
M. Cohen (additional)

References 3 Referenced 31

10.1080/14786440908520612 / Phil. Mag. (1955)
10.1063/1.1754284 / Appl. Phys. Letters (1965)
10.1149/1.2428021 / J. Electrochem. Soc. (1961)

Dates

Type	When
Created	20 years, 5 months ago (March 1, 2005, 12:56 p.m.)
Deposited	1 year, 6 months ago (Feb. 5, 2024, 1:31 a.m.)
Indexed	1 month, 2 weeks ago (July 8, 2025, 2:41 p.m.)
Issued	57 years, 9 months ago (Nov. 1, 1967)
Published	57 years, 9 months ago (Nov. 1, 1967)
Published Print	57 years, 9 months ago (Nov. 1, 1967)

Funders 0

None

BibTeX

@article{Sewell_1967, title={REFLECTION HIGH-ENERGY ELECTRON DIFFRACTION AND X-RAY EMISSION ANALYSIS OF SURFACES AND THEIR REACTION PRODUCTS}, volume={11}, ISSN={1077-3118}, url={http://dx.doi.org/10.1063/1.1755142}, DOI={10.1063/1.1755142}, number={9}, journal={Applied Physics Letters}, publisher={AIP Publishing}, author={Sewell, P. B. and Cohen, M.}, year={1967}, month=nov, pages={298–299} }

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