DOI: 10.1063/1.1754252. DIRECT MEASUREMENT OF THE DEPLETION LAYER WIDTH VARIATION VS APPLIED BIAS FOR A <i>P-N</i> JUNCTION

DIRECT MEASUREMENT OF THE DEPLETION LAYER WIDTH VARIATION VS APPLIED BIAS FOR A P-N JUNCTION

10.1063/1.1754252

Crossref journal-article

AIP Publishing

Applied Physics Letters (317)

Bibliography

MacDonald, N. C., & Everhart, T. E. (1965). DIRECT MEASUREMENT OF THE DEPLETION LAYER WIDTH VARIATION VS APPLIED BIAS FOR A P-N JUNCTION. Applied Physics Letters, 7(10), 267â269.

Authors 2

N. C. MacDonald (first)
T. E. Everhart (additional)

References 5 Referenced 34

{'key': '2024020505592180000_r1'}
10.1149/1.2426295 / J. Electrochem. Soc. / Evaluation of Passivated Integrated Circuits using the Scanning Electron Microscope (1964)
10.1109/PROC.1964.3460 / Proc. IEEE / A Novel Method of Semiconductor Device Measurements (1964)
10.1063/1.1754122 / Appl. Phys. Letters / Reversible Changes in Transistor Characteristics Caused by Scanning Electron Microscope Examination (1965)
{'key': '2024020505592180000_r5'}

Dates

Type	When
Created	20 years, 5 months ago (March 1, 2005, 12:40 p.m.)
Deposited	1 year, 6 months ago (Feb. 5, 2024, 12:59 a.m.)
Indexed	1 year, 6 months ago (Feb. 5, 2024, 3:14 a.m.)
Issued	59 years, 9 months ago (Nov. 15, 1965)
Published	59 years, 9 months ago (Nov. 15, 1965)
Published Print	59 years, 9 months ago (Nov. 15, 1965)

Funders 0

None

BibTeX

@article{MacDonald_1965, title={DIRECT MEASUREMENT OF THE DEPLETION LAYER WIDTH VARIATION VS APPLIED BIAS FOR A P-N JUNCTION}, volume={7}, ISSN={1077-3118}, url={http://dx.doi.org/10.1063/1.1754252}, DOI={10.1063/1.1754252}, number={10}, journal={Applied Physics Letters}, publisher={AIP Publishing}, author={MacDonald, N. C. and Everhart, T. E.}, year={1965}, month=nov, pages={267–269} }

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