DOI: 10.1063/1.1740964. X-Ray Diffraction Camera for Microtechniques

X-Ray Diffraction Camera for Microtechniques

10.1063/1.1740964

Crossref journal-article

AIP Publishing

Review of Scientific Instruments (317)

Abstract

A description of an x-ray diffraction camera for recording diffraction phenomena from selected microscopic regions of solid materials is presented. Replaceable collimator systems limit beam diameters from 100 to 25 microns. The camera body may be removed from its support and replaced without readjustment.

Bibliography

Chesley, F. G. (1947). X-Ray Diffraction Camera for Microtechniques. Review of Scientific Instruments, 18(6), 422â424.

Authors 1

Frank G. Chesley (first)

References 4 Referenced 58

{'key': '2024020520544775300_r1'}
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10.1063/1.1707440 / J. App. Phys. (1944)
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Dates

Type	When
Created	20 years, 6 months ago (Feb. 12, 2005, 4:58 p.m.)
Deposited	1 year, 6 months ago (Feb. 5, 2024, 4:35 p.m.)
Indexed	2 months, 1 week ago (June 26, 2025, 8:30 a.m.)
Issued	78 years, 3 months ago (June 1, 1947)
Published	78 years, 3 months ago (June 1, 1947)
Published Print	78 years, 3 months ago (June 1, 1947)

Funders 0

None

BibTeX

@article{Chesley_1947, title={X-Ray Diffraction Camera for Microtechniques}, volume={18}, ISSN={1089-7623}, url={http://dx.doi.org/10.1063/1.1740964}, DOI={10.1063/1.1740964}, number={6}, journal={Review of Scientific Instruments}, publisher={AIP Publishing}, author={Chesley, Frank G.}, year={1947}, month=jun, pages={422–424} }

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