DOI: 10.1063/1.1737075. Electronic structure of ZnO nanorods studied by angle-dependent x-ray absorption spectroscopy and scanning photoelectron microscopy

Electronic structure of ZnO nanorods studied by angle-dependent x-ray absorption spectroscopy and scanning photoelectron microscopy

10.1063/1.1737075

Crossref journal-article

AIP Publishing

Applied Physics Letters (317)

Abstract

Angle-dependent x-ray absorption near-edge structure (XANES) and scanning photoelectron microscopy measurements were performed to differentiate local electronic structures at the tips and sidewalls of highly aligned ZnO nanorods. The overall intensity of the O K-edge XANES spectra is greatly enhanced for small photon incident angles. In contrast, the overall intensity of the Zn K-edge XANES is much less sensitive to the photon incident angle. Both valence-band photoemission and O K-edge XANES spectra show substantial enhancement of O 2p derived states near the valence band maximum and conduction band minimum, respectively. The spatially resolved Zn 3d core level spectra from tip and sidewall regions show the lack of chemical shift. All the results consistently suggest that the tip surfaces of the highly aligned ZnO nanorods are terminated by O ions and the nanorods are oriented in the [0001̄] direction.

Bibliography

Chiou, J. W., Jan, J. C., Tsai, H. M., Bao, C. W., Pong, W. F., Tsai, M.-H., Hong, I.-H., Klauser, R., Lee, J. F., Wu, J. J., & Liu, S. C. (2004). Electronic structure of ZnO nanorods studied by angle-dependent x-ray absorption spectroscopy and scanning photoelectron microscopy. Applied Physics Letters, 84(18), 3462â3464.

Authors 11

J. W. Chiou (first)
J. C. Jan (additional)
H. M. Tsai (additional)
C. W. Bao (additional)
W. F. Pong (additional)
M.-H. Tsai (additional)
I.-H. Hong (additional)
R. Klauser (additional)
J. F. Lee (additional)
J. J. Wu (additional)
S. C. Liu (additional)

References 19 Referenced 107

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Dates

Type	When
Created	21 years, 4 months ago (April 26, 2004, 6:12 p.m.)
Deposited	1 year, 6 months ago (Feb. 3, 2024, 10:05 p.m.)
Indexed	4 months, 1 week ago (April 21, 2025, 11:25 a.m.)
Issued	21 years, 3 months ago (May 3, 2004)
Published	21 years, 3 months ago (May 3, 2004)
Published Print	21 years, 3 months ago (May 3, 2004)

Funders 0

None

BibTeX

@article{Chiou_2004, title={Electronic structure of ZnO nanorods studied by angle-dependent x-ray absorption spectroscopy and scanning photoelectron microscopy}, volume={84}, ISSN={1077-3118}, url={http://dx.doi.org/10.1063/1.1737075}, DOI={10.1063/1.1737075}, number={18}, journal={Applied Physics Letters}, publisher={AIP Publishing}, author={Chiou, J. W. and Jan, J. C. and Tsai, H. M. and Bao, C. W. and Pong, W. F. and Tsai, M.-H. and Hong, I.-H. and Klauser, R. and Lee, J. F. and Wu, J. J. and Liu, S. C.}, year={2004}, month=may, pages={3462–3464} }

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