Abstract
For cylindrical semiconductor components, computation of spreading resistance is considered a boundary value problem of the solid circular cylinder. Solutions of this problem may be used, for example, to characterize the thermal spreading resistance within the package of a semiconductor device, the electrical spreading resistance in a mesa type parametric diode, and the extrinsic collector resistance of a mesa transistor. Equations describing the thermal (or electrical) spreading resistance are presented in graphical form for a range of geometrical parameters applicable to many practical situations. Further, examples are given for the potential distribution within each cylindrical structure considered in this analysis.
Dates
Type | When |
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Created | 20 years, 4 months ago (April 25, 2005, 3:12 p.m.) |
Deposited | 1 year, 6 months ago (Feb. 1, 2024, 2:24 p.m.) |
Indexed | 3 weeks, 6 days ago (July 30, 2025, 8:24 p.m.) |
Issued | 65 years ago (Aug. 1, 1960) |
Published | 65 years ago (Aug. 1, 1960) |
Published Print | 65 years ago (Aug. 1, 1960) |
@article{Kennedy_1960, title={Spreading Resistance in Cylindrical Semiconductor Devices}, volume={31}, ISSN={1089-7550}, url={http://dx.doi.org/10.1063/1.1735869}, DOI={10.1063/1.1735869}, number={8}, journal={Journal of Applied Physics}, publisher={AIP Publishing}, author={Kennedy, David P.}, year={1960}, month=aug, pages={1490–1497} }