Crossref journal-article
AIP Publishing
Journal of Applied Physics (317)
Abstract

A formula for the resolution of the field ion microscope is derived by considering that most of the ions originate from rebounding molecules after random elastic collision with the surface. Cooling the tip with solid N2 or liquid H2 in order to obtain a large accommodation coefficient drastically reduces the lateral velocity of the ions in a helium operated microscope. As a result the potential resolution for a tip of radius 1000 A is improved to 1.5 A. Photographs show the individual atoms of a tungsten surface. The actual resolution is sufficient to resolve neighboring atoms with 2.74 A separation.

Bibliography

Müller, E. W. (1956). Resolution of the Atomic Structure of a Metal Surface by the Field Ion Microscope. Journal of Applied Physics, 27(5), 474–476.

Authors 1
  1. Erwin W. Müller (first)
References 12 Referenced 171
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Dates
Type When
Created 20 years, 3 months ago (April 22, 2005, 11:55 a.m.)
Deposited 1 year, 6 months ago (Feb. 1, 2024, 5:07 p.m.)
Indexed 1 month ago (July 14, 2025, 11:19 p.m.)
Issued 69 years, 3 months ago (May 1, 1956)
Published 69 years, 3 months ago (May 1, 1956)
Published Print 69 years, 3 months ago (May 1, 1956)
Funders 0

None

@article{M_ller_1956, title={Resolution of the Atomic Structure of a Metal Surface by the Field Ion Microscope}, volume={27}, ISSN={1089-7550}, url={http://dx.doi.org/10.1063/1.1722406}, DOI={10.1063/1.1722406}, number={5}, journal={Journal of Applied Physics}, publisher={AIP Publishing}, author={Müller, Erwin W.}, year={1956}, month=may, pages={474–476} }